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Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases.
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- Materials (1996-1944), 2023, v. 16, n. 8, p. 3005, doi. 10.3390/ma16083005
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- Article
Investigation of the RF Sputtering Process and the Properties of Deposited Silicon Oxynitride Layers under Varying Reactive Gas Conditions.
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- Materials (1996-1944), 2022, v. 15, n. 18, p. 6313, doi. 10.3390/ma15186313
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- Article
Reactive Sputter Deposition of Ga 2 O 3 Thin Films Using Liquid Ga Target.
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- Coatings (2079-6412), 2023, v. 13, n. 9, p. 1550, doi. 10.3390/coatings13091550
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- Article
Examination of the Hydrogen Incorporation into Radio Frequency-Sputtered Hydrogenated SiN x Thin Films.
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- Coatings (2079-6412), 2021, v. 11, n. 1, p. 54, doi. 10.3390/coatings11010054
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- Article
Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si1-xGex for the entire range of compositions towards a database for optoelectronics.
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- Scientific Reports, 2020, v. 10, n. 1, p. N.PAG, doi. 10.1038/s41598-020-74881-5
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- Article
On the formation of blisters in annealed hydrogenated a-Si layers.
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- Nanoscale Research Letters, 2013, v. 8, n. 2, p. 1, doi. 10.1186/1556-276X-8-84
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- Article
Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory.
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- Applied Sciences (2076-3417), 2018, v. 8, n. 5, p. 826, doi. 10.3390/app8050826
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- Article