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Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples.
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- Rapid Communications in Mass Spectrometry: RCM, 2014, v. 28, n. 8, p. 917, doi. 10.1002/rcm.6867
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- Article
Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment.
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- Rapid Communications in Mass Spectrometry: RCM, 2013, v. 27, n. 13, p. 1490, doi. 10.1002/rcm.6599
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- Article
Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.
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- Rapid Communications in Mass Spectrometry: RCM, 2009, v. 23, n. 20, p. 3264, doi. 10.1002/rcm.4250
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Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.
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- Rapid Communications in Mass Spectrometry: RCM, 2009, v. 23, n. 11, p. 1601, doi. 10.1002/rcm.4046
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Mass analysis by Ar-GCIB-dynamic SIMS for organic materials.
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- Surface & Interface Analysis: SIA, 2015, v. 47, n. 2, p. 295, doi. 10.1002/sia.5705
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- Article
Mass analysis by Ar-GCIB-dynamic SIMS for organic materials.
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- Surface & Interface Analysis: SIA, 2015, v. 47, n. 2, p. 298, doi. 10.1002/sia.5707
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- Article
Mass analysis by Ar-GCIB-dynamic SIMS for organic materials.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1212, doi. 10.1002/sia.5696
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Analysis of liquid materials in low vacuum with Wet-SIMS.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1133, doi. 10.1002/sia.5528
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- Article
Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1129, doi. 10.1002/sia.5518
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- Article
Development of organic SIMS system with Ar-GCIB and IMS-4f.
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- Surface & Interface Analysis: SIA, 2014, v. 46, p. 368, doi. 10.1002/sia.5671
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Lipid compounds analysis with MeV-SIMS apparatus for biological applications.
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- Surface & Interface Analysis: SIA, 2014, v. 46, p. 353, doi. 10.1002/sia.5524
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Ion-induced damage evaluation with Ar cluster ion beams.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 167, doi. 10.1002/sia.5014
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- Article
Cold ablation driven by localized forces in alkali halides.
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- Nature Communications, 2014, v. 5, n. 5, p. 3863, doi. 10.1038/ncomms4863
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Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry.
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- Rapid Communications in Mass Spectrometry: RCM, 2016, v. 30, n. 4, p. 476, doi. 10.1002/rcm.7455
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- Article
Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 95, doi. 10.1002/sia.3587
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The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 221, doi. 10.1002/sia.3656
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Using ellipsometry for the evaluation of surface damage and sputtering yield in organic films with irradiation of argon cluster ion beams.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 84, doi. 10.1002/sia.3452
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- Article