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Works matching AU Schvittz, Rafael B.

Results: 4

1

Evaluating Aging Effects Impact on Radiation Robustness of Combinational Gates in ASAP7 FinFet Technology.

Published in:

Journal of Integrated Circuits & Systems, 2025, v. 20, n. 1, p. 1, doi. 10.29292/jics.v20i1.965

By:

Guterres, Eduarda C.;
Schvittz, Rafael B.;
Butzen, Paulo F.

Publication type:

Article

2

SET-SAT: Evaluating the Impact of Cell Area on SET Susceptibility Across Layout of Standard Cells.

Published in:

Journal of Integrated Circuits & Systems, 2025, v. 20, n. 1, p. 1, doi. 10.29292/jics.v20i1.963

By:

Pietro, Mateus E.;
Meinhardt, Cristina;
Schvittz, Rafael B.

Publication type:

Article

3

Survey on Reliability Estimation in Digital Circuits.

Published in:

Journal of Integrated Circuits & Systems, 2021, v. 16, n. 3, p. 1, doi. 10.29292/jics.v16i3.568

By:

Pontes, Matheus F.;
Farias, Clayton R.;
Schvittz, Rafael B.;
Butzen, Paulo F.;
da Rosa Jr., Leomar S.

Publication type:

Article

4

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 4, p. 409, doi. 10.1007/s10836-023-06072-9

By:

Balen, Tiago R.;
González, Carlos J.;
Oliveira, Ingrid F. V.;
da Rosa Jr, Leomar S.;
Soares, Rafael I.;
Schvittz, Rafael B.;
Added, Nemitala;
Macchione, Eduardo L. A.;
Aguiar, Vitor A. P.;
Guazzelli, Marcilei A.;
Medina, Nilberto H.;
Butzen, Paulo F.

Publication type:

Article