Works by Schlueter, Christoph


Results: 26
    1
    2

    Role and Optimization of the Active Oxide Layer in TiO<sub>2</sub>-Based RRAM.

    Published in:
    Advanced Functional Materials, 2016, v. 26, n. 4, p. 507, doi. 10.1002/adfm.201503522
    By:
    • Regoutz, Anna;
    • Gupta, Isha;
    • Serb, Alexantrou;
    • Khiat, Ali;
    • Borgatti, Francesco;
    • Lee, Tien‐Lin;
    • Schlueter, Christoph;
    • Torelli, Piero;
    • Gobaut, Benoit;
    • Light, Mark;
    • Carta, Daniela;
    • Pearce, Stuart;
    • Panaccione, Giancarlo;
    • Prodromakis, Themistoklis
    Publication type:
    Article
    3
    4
    5
    6
    7
    8
    9
    10
    11
    12
    13
    14
    15

    Modulation-doping a correlated electron insulator.

    Published in:
    Nature Communications, 2023, v. 14, n. 1, p. 1, doi. 10.1038/s41467-023-41816-3
    By:
    • Mondal, Debasish;
    • Mahapatra, Smruti Rekha;
    • Derrico, Abigail M.;
    • Rai, Rajeev Kumar;
    • Paudel, Jay R.;
    • Schlueter, Christoph;
    • Gloskovskii, Andrei;
    • Banerjee, Rajdeep;
    • Hariki, Atsushi;
    • DeGroot, Frank M. F.;
    • Sarma, D. D.;
    • Narayan, Awadhesh;
    • Nukala, Pavan;
    • Gray, Alexander X.;
    • Aetukuri, Naga Phani B.
    Publication type:
    Article
    16

    Tackling Disorder in γ‐Ga<sub>2</sub>O<sub>3</sub>.

    Published in:
    Advanced Materials, 2022, v. 34, n. 37, p. 1, doi. 10.1002/adma.202204217
    By:
    • Ratcliff, Laura E.;
    • Oshima, Takayoshi;
    • Nippert, Felix;
    • Janzen, Benjamin M.;
    • Kluth, Elias;
    • Goldhahn, Rüdiger;
    • Feneberg, Martin;
    • Mazzolini, Piero;
    • Bierwagen, Oliver;
    • Wouters, Charlotte;
    • Nofal, Musbah;
    • Albrecht, Martin;
    • Swallow, Jack E. N.;
    • Jones, Leanne A. H.;
    • Thakur, Pardeep K.;
    • Lee, Tien‐Lin;
    • Kalha, Curran;
    • Schlueter, Christoph;
    • Veal, Tim D.;
    • Varley, Joel B.
    Publication type:
    Article
    17
    18
    19
    20
    21

    Trap‐Assisted Memristive Switching in HfO<sub>2</sub>‐Based Devices Studied by In Situ Soft and Hard X‐Ray Photoelectron Spectroscopy.

    Published in:
    Advanced Electronic Materials, 2023, v. 9, n. 6, p. 1, doi. 10.1002/aelm.202201226
    By:
    • Zahari, Finn;
    • Marquardt, Richard;
    • Kalläne, Matthias;
    • Gronenberg, Ole;
    • Schlueter, Christoph;
    • Matveyev, Yury;
    • Haberfehlner, Georg;
    • Diekmann, Florian;
    • Nierhauve, Alena;
    • Buck, Jens;
    • Hanff, Arndt;
    • Kolhatkar, Gitanjali;
    • Kothleitner, Gerald;
    • Kienle, Lorenz;
    • Ziegler, Martin;
    • Carstensen, Jürgen;
    • Rossnagel, Kai;
    • Kohlstedt, Hermann
    Publication type:
    Article
    22
    23
    24
    25
    26