Works matching AU Samukawa, Seiji


Results: 12
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    Neutral beam etching for device isolation in AlGaN/GaN HEMTs.

    Published in:
    Physica Status Solidi. A: Applications & Materials Science, 2017, v. 214, n. 3, p. n/a, doi. 10.1002/pssa.201600617
    By:
    • Hemmi, Fuyumi;
    • Thomas, Cedric;
    • Lai, Yi‐Chun;
    • Higo, Akio;
    • Guo, Alex;
    • Warnock, Shireen;
    • del Alamo, Jesús A.;
    • Samukawa, Seiji;
    • Otsuji, Taiichi;
    • Suemitsu, Tetsuya
    Publication type:
    Article
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