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Electrical and Dielectric Properties of a Dy<sub>2</sub>O<sub>3</sub> MOS Capacitor.
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- Journal of Electronic Materials, 2022, v. 51, n. 3, p. 1250, doi. 10.1007/s11664-021-09391-9
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Atomic force microscopy and ellipsometry investigations of rare earth oxide Dy<sub>2</sub>O<sub>3</sub> nano-layer processed by electron beam evaporation on n-GaAs substrate.
- Published in:
- Optical & Quantum Electronics, 2024, v. 56, n. 3, p. 1, doi. 10.1007/s11082-023-05866-7
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- Article