Multidimensional Data Sets - Presentation, Evaluation and Extraction.Published in:Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 642, doi. 10.1017/S1431927614004930By:Haschke, M.;Waldschläger, U.;Tagle, R.;Rossek, U.Publication type:Article
Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany.Published in:2012By:Haschke, M.;Waldschläger, U.;Tagle, R.;Rossek, U.Publication type:Abstract
Preparation and Characterization of MBE-grown Si/CaF.Published in:Crystal Research & Technology, 1993, v. 28, n. 7, p. 899, doi. 10.1002/crat.2170280703By:Rossek, U.;Mäder, M.;Tempel, A.Publication type:Article