Found: 18
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Charging of Ion-Implanted Dielectrics by Electron Irradiation.
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- Technical Physics, 2019, v. 64, n. 8, p. 1205, doi. 10.1134/S1063784219080188
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- Article
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopy.
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- Scanning, 2001, v. 23, n. 5, p. 305, doi. 10.1002/sca.4950230503
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- Article
Fundamental problems of imaging subsurface structures in the backscattered electron mode in scanning electron microscopy.
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- Scanning, 2001, v. 23, n. 4, p. 235, doi. 10.1002/sca.4950230403
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- Article
An anomalous contrast in scanning electron microscopy of insulators: The pseudo-mirror effect.
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- Scanning, 2000, v. 22, n. 6, p. 352, doi. 10.1002/sca.4950220603
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- Article
An annular toroidal backscattered electron energy analyser for use in scanning electron microscopy.
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- Scanning, 1996, v. 18, n. 8, p. 556, doi. 10.1002/sca.4950180804
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- Article
Scanning microscopies of indented MgO crystals.
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- Scanning, 1992, v. 14, n. 2, p. 91, doi. 10.1002/sca.4950140206
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- Article
Microrecording and information reproduction with SEM.
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- Scanning, 1988, v. 10, n. 5, p. 207, doi. 10.1002/sca.4950100508
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- Article
SEM tomography: Solid-state media and microfields.
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- Scanning, 1988, v. 10, n. 5, p. 191, doi. 10.1002/sca.4950100505
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- Article
An SEM-minicomputer system to study p-n junctions under EBIC and EBIV.
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- Scanning, 1983, v. 5, n. 3, p. 123, doi. 10.1002/sca.4950050302
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- Article
The application of the SEM in the study of soils.
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- Scanning, 1980, v. 3, n. 4, p. 262, doi. 10.1002/sca.4950030402
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- Article
Colour encoding of video signals in SEM.
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- Scanning, 1980, v. 3, n. 3, p. 242, doi. 10.1002/sca.4950030321
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- Article
Scanning electron microscopy of two-dimensional magnetic stray fields.
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- Scanning, 1980, v. 3, n. 1, p. 27, doi. 10.1002/sca.4950030104
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- Article
A Noncontact Electron-Probe Method for Measuring the Diffusion Length and the Lifetime of Minority Charge Carriers in Semiconductors.
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- Semiconductors, 2001, v. 35, n. 6, p. 718, doi. 10.1134/1.1379412
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- Article
Expanding the Analytical Capabilities of Scanning Electron Microscopy in the Detection of Backscattered Electrons.
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- Instruments & Experimental Techniques, 2023, v. 66, n. 6, p. 1058, doi. 10.1134/S0020441223040097
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- Article
A method and devices of electron microtomography in scanning electron microscopy.
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- Instruments & Experimental Techniques, 2010, v. 53, n. 4, p. 581, doi. 10.1134/S0020441210040202
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- Article
Influence of Zn<sup>+</sup>-Ion Implantation on the Process of Sapphire Charging by an Electron Beam.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2018, v. 12, n. 2, p. 213, doi. 10.1134/S1027451018020143
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- Article
Quantitative morphological analysis in a SEM-microcomputer system-II. Morphological analysis of complex SEM images.
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- Journal of Microscopy, 1984, v. 135, n. 1, p. 13, doi. 10.1111/j.1365-2818.1984.tb04645.x
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- Article
Quantitative morphological analysis in a SEM-microcomputer system-I. Quantitative shape analysis of single objects.
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- Journal of Microscopy, 1984, v. 135, n. 1, p. 1, doi. 10.1111/j.1365-2818.1984.tb04644.x
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- Article