Found: 8
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Gas-Sensitive Properties of Nitrogen-Rich Carbon Nitride Films.
- Published in:
- Advanced Materials, 2000, v. 12, n. 9, p. 656, doi. 10.1002/(SICI)1521-4095(200005)12:9<656::AID-ADMA656>3.0.CO;2-S
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- Article
Controllable off-plane deflection of cantilevers for multiple scanning proximity probe arrays.
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- Applied Physics A: Materials Science & Processing, 2008, v. 92, n. 3, p. 525, doi. 10.1007/s00339-008-4668-y
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- Article
Towards the implanting of ions and positioning of nanoparticles with nm spatial resolution.
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- Applied Physics A: Materials Science & Processing, 2008, v. 91, n. 4, p. 567, doi. 10.1007/s00339-008-4515-1
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- Article
Diffraction under total internal reflection for micro-fluidic analysis.
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- Applied Physics A: Materials Science & Processing, 2006, v. 84, n. 1/2, p. 191, doi. 10.1007/s00339-006-3597-x
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- Article
Concept of deterministic single ion doping with sub-nm spatial resolution.
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- Applied Physics A: Materials Science & Processing, 2006, v. 83, n. 2, p. 321, doi. 10.1007/s00339-006-3497-0
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- Article
Radicals transport modelling in NANOJET.
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- Applied Physics A: Materials Science & Processing, 2005, v. 81, n. 8, p. 1661, doi. 10.1007/s00339-005-3332-z
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- Article
Quantum Computer Development with Single Ion Implantation.
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- Quantum Information Processing, 2004, v. 3, n. 1-5, p. 233, doi. 10.1007/s11128-004-3879-1
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- Article
Piezoresistive SXM sensors.
- Published in:
- Surface & Interface Analysis: SIA, 2002, v. 33, n. 2, p. 59, doi. 10.1002/sia.1162
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- Article