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EDS MICROANALYSIS WITH THE SILICON DRIFT DETECTOR (SDD): INNOVATIVE ANALYSIS OPTIONS FOR MINERALOGICAL AND MATERIAL SCIENCE APPLICATIONS.
- Published in:
- Anadolu University Journal of Sciences & Technology, 2009, v. 10, n. 1, p. 45
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- Publication type:
- Article
EDS MICROANALYSIS WITH THE SILICON DRIFT DETECTOR (SDD): INNOVATIVE ANALYSIS OPTIONS FOR MINERALOGICAL AND MATERIAL SCIENCE APPLICATIONS.
- Published in:
- Anadolu University Journal of Sciences & Technology, 2009, v. 10, n. 1, p. 45
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- Publication type:
- Article
Quantitative Analysis with EDS and WDS at High Count Rates.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.103
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- Article
Theoretical Calculation and Experimental Determination of X-ray Production Efficiencies for Copper, Zirconium, and Tungsten.
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- 2023
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- Abstract
EDS and WDS Analysis of Ni-Si Samples at Low Acceleration Voltages.
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- 2023
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- Abstract
Improvement of Quantitative STEM/EDXS Analyses for Chemical Analysis of Cu(In,Ga)Se<sub>2</sub> Solar Cells with Zn(O,S) Buffer Layers.
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- Microscopy & Microanalysis, 2023, v. 29, n. 1, p. 69, doi. 10.1093/micmic/ozac031
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- Article
Measurement and Calculation of X-Ray Production Efficiencies for Copper, Zirconium, and Tungsten.
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- Microscopy & Microanalysis, 2022, v. 28, n. 6, p. 1865, doi. 10.1017/S1431927622012351
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- Article
Determination of Thin Film Thickness and Composition using Energy Dispersive EPMA.
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- 2022
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- Abstract
Definition of the Detection Limit in Energy-dispersive Spectrometry.
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- 2020
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- Abstract
Definition of the Detection Limit in Energy-dispersive Spectrometry.
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- 2020
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- Abstract
Check of the Performance of EDS Systems Attached to the SEM with the Test Material EDS-TM001/2 and Evaluation Software Package EDS Spectrometer Test -Application, Experiences and Updates.
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- 2019
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- Abstract
Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors.
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- 2019
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- Abstract
New Approaches to Determine K Line Ratios of Pure Elements.
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- 2019
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- Abstract
Composition and Thickness Mapping Using STEM EDS.
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- 2019
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- Abstract
Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors.
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- 2018
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- Abstract
New Approaches to Determine K Line Ratios of Pure Elements.
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- 2018
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- Abstract
Composition and Thickness Mapping Using STEM EDS.
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- 2018
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- Abstract
Check of the Performance of EDS Systems Attached to the SEM with the Test Material EDS-TM001/2 and Evaluation Software Package EDS Spectrometer Test -Application, Experiences and Updates.
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- 2018
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- Publication type:
- Abstract
Relative uncertainties in mass attenuation coefficients and their influence on quantitative EDS and WDS analysis.
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- Microscopy & Microanalysis, 2017, v. 23, p. 500, doi. 10.1017/S143192761700318X
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- Article
Probing the Element Distribution at the Organic-Inorganic Interface Using EDS.
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- Microscopy & Microanalysis, 2017, v. 23, p. 6, doi. 10.1017/S143192761700071X
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- Article
Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields.
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- Microscopy & Microanalysis, 2016, v. 22, n. 6, p. 1360, doi. 10.1017/S1431927616011788
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- Article
On the Characterization of the Geometrical Collection Efficiency of Modern EDS Systems.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1144, doi. 10.1017/S1431927614007454
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- Article
Measurement of Atomic Fractions in Cu(In,Ga)Se2 Films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA).
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 402, doi. 10.1017/S1431927614003730
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- Article
Reinvestigation of the M Emission Spectrum of Uranium-92.
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- Microscopy & Microanalysis, 2011, v. 17, n. 2, p. 296, doi. 10.1017/S1431927611000067
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- Article
The Determination of the Efficiency of Energy Dispersive X-Ray Spectrometers by a New Reference Material.
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- Microscopy & Microanalysis, 2006, v. 12, n. 5, p. 406, doi. 10.1017/s1431927606060557
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- Article
Advances in Technology and Application of Silicon Drift Detectors.
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- Microscopy & Microanalysis, 2005, v. 11, p. 460, doi. 10.1017/S1431927605505439
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- Article
Elemental composition and thickness determination of thin films by electron probe microanalysis.
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- Surface & Interface Analysis: SIA, 2023, v. 55, n. 6, p. 496, doi. 10.1002/sia.7183
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- Article
Analysis of elemental composition of Fe<sub>1‐x</sub>Ni<sub>x</sub> and Si<sub>1‐x</sub>Ge<sub>x</sub> alloy thin films by electron probe microanalysis and micro‐focus X‐ray fluorescence.
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- Surface & Interface Analysis: SIA, 2020, v. 52, n. 12, p. 929, doi. 10.1002/sia.6834
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- Article
Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector.
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- Microscopy Today, 2017, v. 25, n. 2, p. 30, doi. 10.1017/S1551929517000141
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- Article