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X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab.
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- Particle & Particle Systems Characterization, 2009, v. 26, n. 3, p. 112, doi. 10.1002/ppsc.200800052
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- Article
A new method for texture measurements using a general area detector diffraction system.
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- Powder Diffraction, 2003, v. 18, n. 2, p. 99, doi. 10.1154/1.1577353
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- Article