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In situ Comparative heating and simultaneous multi-detector imaging at high and ultra-low landing energies.
- Published in:
- 2021
- By:
- Publication type:
- Abstract
In situ Comparative heating and simultaneous multi-detector imaging at high and ultra-low landing energies.
- Published in:
- 2021
- By:
- Publication type:
- Abstract
Broadband Dielectric Spectroscopy as a Potential Label-Free Method to Rapidly Verify Ultraviolet-C Radiation Disinfection.
- Published in:
- Journal of Research of the National Institute of Standards & Technology, 2021, v. 126, p. 1, doi. 10.6028/jres.126.022
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- Article
Ultraviolet Radiation Technologies and Healthcare-Associated Infections: Standards and Metrology Needs.
- Published in:
- Journal of Research of the National Institute of Standards & Technology, 2021, v. 126, p. 1, doi. 10.6028/jres.126.014
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- Article
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope.
- Published in:
- Microscopy & Microanalysis, 2016, v. 22, n. 4, p. 768, doi. 10.1017/S1431927616011430
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- Article
Low-Loss Electron Imaging for Enhanced Surface Detail in the Scanning Electron Microscope: The Contributions of Oliver C. Wells.
- Published in:
- Microscopy Today, 2015, v. 23, n. 1, p. 24, doi. 10.1017/S1551929514001370
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- Publication type:
- Article
Oliver C. Wells' Vision: Use of Low-Loss Electrons to Enhance and Measure the Surface Detail in the Scanning Electron Microscope at High Resolution.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 4, doi. 10.1017/S1431927614001743
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- Article
Does your SEM really tell the truth? How would you know? Part 2.
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- Scanning, 2014, v. 36, n. 3, p. 347, doi. 10.1002/sca.21124
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- Article
Helium Ion Microscopy, Principles and Applications.
- Published in:
- 2014
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- Publication type:
- Book Review
Does your SEM Really tell the truth?-how would you know? Part 1.
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- Scanning, 2013, v. 35, n. 6, p. 355, doi. 10.1002/sca.21075
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- Article
Modeling for accurate dimensional scanning electron microscope metrology: then and now.
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- Scanning, 2011, v. 33, n. 3, p. 111, doi. 10.1002/sca.20238
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- Article
Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift.
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- Microscopy & Microanalysis, 2011, v. 17, n. 2, p. 302, doi. 10.1017/S1431927610094250
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- Article
Helium ion microscopy and its application to nanotechnology and nanometrology.
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- Scanning, 2008, v. 30, n. 6, p. 457, doi. 10.1002/sca.20129
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- Publication type:
- Article
Nanotip electron gun for the scanning electron microscope.
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- Scanning, 2006, v. 28, n. 3, p. 133, doi. 10.1002/sca.4950280301
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- Publication type:
- Article
New application of variable-pressure/environmental microscopy to semiconductor inspection and metrology.
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- Scanning, 2004, v. 26, n. 1, p. 11, doi. 10.1002/sca.4950260103
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- Publication type:
- Article
Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research.
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- Scanning, 2002, v. 24, n. 4, p. 179, doi. 10.1002/sca.4950240404
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- Article
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part II- chemically-mechanically planarized samples.
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- Scanning, 2001, v. 23, n. 6, p. 366, doi. 10.1002/sca.4950230602
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- Publication type:
- Article
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1- applications to accurate dimension measurements.
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- Scanning, 2001, v. 23, n. 5, p. 298, doi. 10.1002/sca.4950230502
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- Article
Image sharpness measurement in the scanning electron microscope-Part III.
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- Scanning, 1999, v. 21, n. 4, p. 246, doi. 10.1002/sca.4950210404
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- Article
National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed.
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- Microscopy & Microanalysis, 1998, p. 22, doi. 10.1017/S1431927600020237
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- Article
Inexpensive digital imaging?
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- Scanning, 1997, v. 19, n. 4, p. 297, doi. 10.1002/sca.4950190409
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- Article
An approach to the reduction of hydrocarbon contamination in the scanning electron microscope.
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- Scanning, 1996, v. 18, n. 4, p. 269, doi. 10.1002/sca.1996.4950180402
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- Article
Digital imaging for scanning electron microscopy.
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- Scanning, 1996, v. 18, n. 1, p. 1, doi. 10.1002/sca.1996.4950180101
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- Article
Is your scanning electron microscope Hi-Fi?
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- Scanning, 1995, v. 17, n. 5, p. 287, doi. 10.1002/sca.4950170504
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- Article
Modification of a commercial SEM with a computer controlled cathode stabilized power supply.
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- Scanning, 1993, v. 15, n. 4, p. 208, doi. 10.1002/sca.4950150405
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- Publication type:
- Article
VALVE MORPHOLOGY OF SYNEDRA GOULARDI (BACILLARIOPHYCEAE).
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- Journal of Phycology, 1981, v. 17, n. 4, p. 412, doi. 10.1111/j.0022-3646.1981.00412.x
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- Article
Thiocarbohydrazide binding for botanical specimens for scanning electron microscopy: a modification.
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- Journal of Microscopy, 1977, v. 110, n. 1, p. 71, doi. 10.1111/j.1365-2818.1977.tb00015.x
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- Publication type:
- Article
THE DESMID GENERA SPHAEROZOSMA ONYCHONEMA AND TEILINGIA: AN HISTORICAL APPRAISAL.
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- Journal of Phycology, 1976, v. 12, n. 1, p. 5, doi. 10.1111/j.1529-8817.1976.tb02817.x
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- Article
THECAL ULTRASTRUCTURE OF THE TOXIC MARINE DINOFLAGELLTE GONYAULAX CATENELLA.
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- Journal of Phycology, 1976, v. 12, n. 1, p. 88, doi. 10.1111/j.1529-8817.1976.tb02832.x
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- Publication type:
- Article