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Turning Normal to Abnormal: Reversing CO<sub>2</sub>/C2‐Hydrocarbon Selectivity in HKUST‐1.
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- Advanced Functional Materials, 2024, v. 34, n. 19, p. 1, doi. 10.1002/adfm.202312280
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- Article
Characterizing the Effect of ECAP on Particle Dispersion and Thermal Stability of Internally Oxidized Fe-Y Alloys.
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- Microscopy & Microanalysis, 2019, p. 2220, doi. 10.1017/S1431927618011583
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- Article
A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids.
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- 2019
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- Abstract
Automated Quadrat Analysis Technique for Particle Dispersion Quantification in Oxide Dispersion Strengthened Alloys.
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- Microscopy & Microanalysis, 2019, p. 592, doi. 10.1017/S1431927618003458
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- Article
A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids.
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- 2018
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- Abstract
Automated Quadrat Analysis Technique for Particle Dispersion Quantification in Oxide Dispersion Strengthened Alloys.
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- 2018
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- Abstract
Characterizing the Effect of ECAP on Particle Dispersion and Thermal Stability of Internally Oxidized Fe-Y Alloys.
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- 2018
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- Abstract
Investigating Defect Contrast in GeXSi1-x/Si Epitaxial Structures Using Electron Channeling Contrast Imaging.
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- Microscopy & Microanalysis, 2017, v. 23, p. 574, doi. 10.1017/S1431927617003555
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- Article
Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM.
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- Microscopy & Microanalysis, 2017, v. 23, p. 550, doi. 10.1017/S1431927617003439
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- Article
In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2.
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- Microscopy & Microanalysis, 2015, v. 21, n. 1, p. 140, doi. 10.1017/S1431927614013555
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- Article
In Situ Biasing TEM Characterization of Resistive Switching Phenomena in TiO2-based RRAM.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1548, doi. 10.1017/S1431927614009477
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- Article
Ultrashort Pulsed Laser Induced Heat Affected Zones Characterized by Ion Channeling Contrast Imaging.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1480, doi. 10.1017/S1431927614009131
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- Article
Experimental Investigation of Sub-Surface Deformation using EBSD in Single Crystal Aluminum during Orthogonal Micromachining.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1472, doi. 10.1017/S143192761400909X
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- Article
Strain Associated with Surface-Penetrating Dislocations Visible by Electron Channeling Contrast Imaging.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1076, doi. 10.1017/S1431927614007107
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- Article
Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI).
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1036, doi. 10.1017/S1431927614006904
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- Article
Investigating the Effects of a Heat Treatment on Microstructure of an Ultrahigh Carbon Steel through SEM and In Situ CLSM studies.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 964, doi. 10.1017/S1431927614006540
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- Article
A Method for Quantitative Analysis of Carbide Network Path Lengths in Ultrahigh Carbon Steel.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 874, doi. 10.1017/S1431927614006096
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- Article
Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 552, doi. 10.1017/S1431927614004486
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- Article
Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 344, doi. 10.1017/S1431927614003444
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- Article
Measuring the Strain Sensitivity in Si (001) Electron Channeling Patterns Using Higher-order Laue Zone Line Shifts.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 42, doi. 10.1017/S1431927614001937
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- Article
Oxygen Vacancy Creation, Drift, and Aggregation in TiO<sub>2</sub>-Based Resistive Switches at Low Temperature and Voltage.
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- Advanced Functional Materials, 2015, v. 25, n. 19, p. 2876, doi. 10.1002/adfm.201500444
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- Article
Epitaxial SiC Growth Morphology and Extended Defects Investigated by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging.
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- Journal of Electronic Materials, 2008, v. 37, n. 5, p. 691, doi. 10.1007/s11664-007-0308-0
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- Article
Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling.
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- Microscopy Today, 2012, v. 20, n. 2, p. 12, doi. 10.1017/S1551929512000077
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- Article
Identifying threading dislocations in GaN films and substrates by electron channelling.
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- Journal of Microscopy, 2011, v. 244, n. 3, p. 311, doi. 10.1111/j.1365-2818.2011.03538.x
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- Article
On‐Demand Nanoscale Manipulations of Correlated Oxide Phases.
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- Advanced Functional Materials, 2019, v. 29, n. 49, p. N.PAG, doi. 10.1002/adfm.201905585
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- Article
Effects of Cr Concentration on Cementite Coarsening in Ultrahigh Carbon Steel.
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- Metallurgical & Materials Transactions. Part A, 2019, v. 50, n. 10, p. 4779, doi. 10.1007/s11661-019-05403-w
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- Article
Effects of Nb Modification and Cooling Rate on the Microstructure in an Ultrahigh Carbon Steel.
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- Metallurgical & Materials Transactions. Part A, 2018, v. 49, n. 6, p. 2161, doi. 10.1007/s11661-018-4588-1
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- Article