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Analysis of reliability test results for CMDS LSI and VLSI circuits.
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- Automation & Remote Control, 2011, v. 72, n. 2, p. 449, doi. 10.1134/S0005117911020226
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Programmable Ferromagnet-Semiconductor Logic Devices.
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- Automation & Remote Control, 2004, v. 65, n. 9, p. 1357, doi. 10.1023/B:AURC.0000041416.32126.67
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- Article