The Use of Different Pulsed Electron Irradiation for the Formation of Radiation Defects in Silicon Crystals.Published in:Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4010, doi. 10.1007/s11664-018-6286-6By:Yeritsyan, H. N.;Sahakyan, A. A.;Grigoryan, N. E.;Harutyunyan, V. V.;Grigoryan, B. A.;Amatuni, G. A.;Petrosyan, V. H.;Khachatryan, A. A.;Rhodes, C. J.Publication type:Article
Interaction of the 5 MeV electron beam with the matter in the AREAL photoelectron gun facility experimental hall.Published in:Armenian Journal of Physics, 2017, v. 10, n. 4, p. 163By:Petrosyan, V. H.Publication type:Article
Absorbed Dose Characteristics for the BST Thin Film Irradiation by the 5 MeV Electron Beam.Published in:Armenian Journal of Physics, 2016, v. 9, n. 3, p. 235By:Petrosyan, V. H.Publication type:Article