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Mechanism of Transverse Charge Transfer in Thin Films of Hexagonal Boron Nitride.
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- Journal of Experimental & Theoretical Physics, 2023, v. 136, n. 3, p. 345, doi. 10.1134/S1063776123030135
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- Article
Charge Transport Mechanism in a PECVD Deposited Low-k SiOCH Dielectric.
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- Journal of Electronic Materials, 2022, v. 51, n. 5, p. 2521, doi. 10.1007/s11664-021-09411-8
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- Article
Forming-Free Memristors Based on Hafnium Oxide Processed in Electron Cyclotron Resonance Hydrogen Plasma.
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- JETP Letters, 2022, v. 115, n. 2, p. 79, doi. 10.1134/S0021364022020084
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Atomic and Electronic Structure of SiOx Films Obtained with Hydrogen Electron Cyclotron Resonance Plasma.
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- Journal of Experimental & Theoretical Physics, 2020, v. 131, n. 6, p. 940, doi. 10.1134/S1063776120110084
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- Article
Optical Properties of (ZrO2)1 – x(Y2O3)х (х = 0–0.037) Crystals Grown by Directional Crystallization of the Melt.
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- Optics & Spectroscopy, 2020, v. 128, n. 12, p. 1963, doi. 10.1134/S0030400X20120991
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Optical Properties of the SiO<sub>x</sub> (x < 2) Thin Films Obtained by Hydrogen Plasma Processing of Thermal Silicon Dioxide.
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- Optics & Spectroscopy, 2020, v. 128, n. 10, p. 1577, doi. 10.1134/S0030400X20100173
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Optical Properties of Nonstoichiometric Silicon Oxide SiOx (x < 2).
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- Optics & Spectroscopy, 2019, v. 127, n. 5, p. 836, doi. 10.1134/S0030400X19110183
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Structure of Hf<sub>0.9</sub>La<sub>0.1</sub>O<sub>2</sub> Ferroelectric Films Obtained by the Atomic Layer Deposition.
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- JETP Letters, 2019, v. 109, n. 2, p. 116, doi. 10.1134/S0021364019020115
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- Article
Atomic and Electronic Structures of Metal-Rich Noncentrosymmetric ZrO<sub>x</sub>.
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- JETP Letters, 2018, v. 108, n. 4, p. 226, doi. 10.1134/S002136401816004X
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Atomic and Electronic Structures of Intrinsic Defects in Ta<sub>2</sub>O<sub>5</sub>: Ab Initio Simulation.
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- JETP Letters, 2018, v. 107, n. 12, p. 761, doi. 10.1134/S0021364018120111
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- Article
Optical Properties of Nonstoichiometric Tantalum Oxide TaO<sub>x</sub> (x < 5/2) According to Spectral-Ellipsometry and Raman-Scattering Data.
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- Optics & Spectroscopy, 2018, v. 124, n. 6, p. 808, doi. 10.1134/S0030400X18060140
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- Article
Electronic Structure of Oxygen Vacancies in the Orthorhombic Noncentrosymmetric Phase Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>.
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- JETP Letters, 2018, v. 107, n. 1, p. 55, doi. 10.1134/S0021364018010071
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- Article