Works matching AU Pearton, S.
1
- International Journal of High Speed Electronics & Systems, 2019, v. 28, n. 1/2, p. N.PAG, doi. 10.1142/S012915641940007X
- Mastro, M. A.;
- Hite, J. K.;
- Eddy, C. R.;
- Tadjer, M. J.;
- Pearton, S. J.;
- Ren, F.;
- Kim, J.
- Article
2
- Physica Status Solidi (B), 1982, v. 109, n. 2, p. K135, doi. 10.1002/pssb.2221090254
- Article
3
- Physica Status Solidi (B), 1981, v. 105, n. 1, p. K19, doi. 10.1002/pssb.2221050158
- Article
4
- Advanced Materials, 2000, v. 12, n. 21, p. 1571, doi. 10.1002/1521-4095(200011)12:21<1571::AID-ADMA1571>3.0.CO;2-T
- Article
5
- Advanced Materials, 1992, v. 4, n. 4, p. 306, doi. 10.1002/adma.19920040419
- Article
6
- Journal of Superconductivity & Novel Magnetism, 2010, v. 23, n. 1, p. 161, doi. 10.1007/s10948-009-0551-0
- Buyanova, I. A.;
- Murayama, A.;
- Furuta, T.;
- Oka, Y.;
- Norton, D. P.;
- Pearton, S. J.;
- Osinsky, A.;
- Dong, J. W.;
- Tu, C. W.;
- Chen, W. M.
- Article
7
- Advanced Materials, 2010, v. 22, n. 43, p. 4877, doi. 10.1002/adma.201001798
- Johnson, Jason L.;
- Behnam, Ashkan;
- Pearton, S. J.;
- Ural, Ant
- Article
8
- Journal of Materials Science, 2008, v. 43, n. 21, p. 6925, doi. 10.1007/s10853-008-2988-0
- Tien, L.;
- Pearton, S.;
- Norton, D.;
- Ren, F.
- Article
9
- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2023, v. 178, n. 5/6, p. 680, doi. 10.1080/10420150.2023.2175677
- Lee, Jonathan;
- Silverman, Andrew C.;
- Flitsiyan, Elena;
- Xian, Minghan;
- Ren, Fan;
- Pearton, S. J.
- Article
10
- Applied Physics A: Materials Science & Processing, 2008, v. 91, n. 2, p. 251, doi. 10.1007/s00339-008-4426-1
- Kim, H. S.;
- Erie, J.-M.;
- Pearton, S. J.;
- Norton, D. P.;
- Ren, F.
- Article
11
- Applied Physics A: Materials Science & Processing, 2008, v. 91, n. 2, p. 255, doi. 10.1007/s00339-008-4427-0
- Kim, H. S.;
- Pearton, S. J.;
- Norton, D. P.;
- Ren, F.
- Article
12
- Applied Physics A: Materials Science & Processing, 2008, v. 91, n. 1, p. 29, doi. 10.1007/s00339-007-4378-x
- Tien, L. C.;
- Pearton, S. J.;
- Norton, D. P.;
- Ren, F.
- Article
13
- Applied Physics A: Materials Science & Processing, 2005, v. 81, n. 6, p. 1117, doi. 10.1007/s00339-005-3310-5
- Wang, H. T.;
- Kang, B. S.;
- Ren, F.;
- Tien, L. C.;
- Sadik, P. W.;
- Norton, D. P.;
- Pearton, S. J.;
- Lin, J.
- Article
14
- Applied Physics A: Materials Science & Processing, 2005, v. 80, n. 2, p. 259, doi. 10.1007/s00339-004-2666-2
- Kang, B. S.;
- Kim, S.;
- Ren, F.;
- Ip, K.;
- Heo, Y. W.;
- Gila, B. P.;
- Abernathy, C. R.;
- Norton, D. P.;
- Pearton, S. J.
- Article
15
- Critical Reviews in Solid State & Materials Science, 2000, v. 25, n. 4, p. 279, doi. 10.1080/10408430091149187
- Cao, X. A.;
- Pearton, S. J.;
- Ren, F.
- Article
16
- Critical Reviews in Solid State & Materials Science, 1998, v. 23, n. 4, p. 323, doi. 10.1080/10408439891324202
- Hong, J.;
- Lambers, E. S.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Shul, R. J.;
- Hobson, W. S.
- Article
17
- Chemical Engineering Communications, 2009, v. 196, n. 9, p. 1030, doi. 10.1080/00986440902896956
- Davies, RyanP.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Norton, D. P.;
- Ivill, M. P.;
- Ren, F.
- Article
18
- JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2015, v. 67, n. 7, p. 1601, doi. 10.1007/s11837-015-1359-y
- Pearton, S.;
- Hwang, Ya-Shi;
- Ren, F.
- Article
19
- Journal of Materials Science: Materials in Electronics, 2023, v. 34, n. 15, p. 1, doi. 10.1007/s10854-023-10628-y
- Polyakov, A. Y.;
- Kuznetsov, A.;
- Azarov, A.;
- Miakonkikh, A. V.;
- Chernykh, A. V.;
- Vasilev, A. A.;
- Shchemerov, I. V.;
- Kochkova, A. I.;
- Matros, N. R.;
- Pearton, S. J.
- Article
20
- Physica Status Solidi. A: Applications & Materials Science, 2017, v. 214, n. 10, p. n/a, doi. 10.1002/pssa.201700372
- Lee, In‐Hwan;
- Polyakov, Alexander Y.;
- Smirnov, N. B.;
- Shchemerov, I. V.;
- Shmidt, N. M.;
- Tal'nishnih, N. A.;
- Shabunina, E. I.;
- Cho, Han‐Su;
- Hwang, Sung‐Min;
- Zinovyev, R. A.;
- Didenko, S. I.;
- Lagov, P. B.;
- Pearton, S. J.
- Article
21
- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2007, v. 1, n. 4, p. 380, doi. 10.1134/S1027451007040039
- Govorkov, A.;
- Polyakov, A.;
- Yugova, T.;
- Smirnov, N.;
- Petrova, E.;
- Mezhennyi, M.;
- Markov, A.;
- Lee, I.;
- Pearton, S.
- Article
22
- Semiconductors, 2009, v. 43, n. 5, p. 577, doi. 10.1134/S1063782609050054
- Polyakov, A. Y.;
- Smirnov, N. B.;
- Govorkov, A. V.;
- Kozhukhova, E. A.;
- Kim, H. S.;
- Norton, D. P.;
- Pearton, S. J.;
- Belogorokhov, A. I.
- Article
23
- Journal of Electronic Materials, 2019, v. 48, n. 3, p. 1568, doi. 10.1007/s11664-018-06885-x
- Fares, Chaker;
- Ren, F.;
- Lambers, Eric;
- Hays, David C.;
- Gila, B. P.;
- Pearton, S. J.
- Article
24
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 601, doi. 10.1007/s11664-009-0973-2
- Polyakov, A.;
- Smirnov, N.;
- Govorkov, A.;
- Kozhukhova, E.;
- Belogorokhov, A.;
- Norton, D.;
- Kim, H.;
- Pearton, S.
- Article
25
- Journal of Electronic Materials, 2009, v. 38, n. 4, p. 490, doi. 10.1007/s11664-008-0596-z
- Johnson, Jason L.;
- Yongho Choi;
- Ural, Ant;
- Lim, Wantae;
- Wright, J. S.;
- Gila, B. P.;
- Ren, F.;
- Pearton, S. J.
- Article
26
- Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1426, doi. 10.1007/s11664-008-0416-5
- PEARTON, S. J.;
- LIM, W. T.;
- WRIGHT, J. S.;
- TIEN, L. C.;
- KIM, H. S.;
- NORTON, D. P.;
- WANG, H. T.;
- KANG, B. S.;
- REN, F.;
- JUN, J.;
- LIN, J.;
- OSINSKY, A.
- Article
27
- Journal of Electronic Materials, 2008, v. 37, n. 5, p. 550, doi. 10.1007/s11664-007-0298-y
- Kang, B. S.;
- Wang, H. T.;
- Ren, F.;
- Hlad, M.;
- Gila, B. P.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Li, C.;
- Low, Z. N.;
- Lin, J.;
- Johnson, J. W.;
- Rajagopal, P.;
- Roberts, J. C.;
- Piner, E. L.;
- Linthicum, K. J.
- Article
28
- Journal of Electronic Materials, 2008, v. 37, n. 4, p. 384, doi. 10.1007/s11664-007-0326-y
- Anderson, T. J.;
- Ren, F.;
- Kim, J.;
- Lin, J.;
- Hlad, M.;
- Gila, B. P.;
- Voss, L.;
- Pearton, S. J.;
- Bove, P.;
- Lahreche, H.;
- Thuret, J.
- Article
29
- Journal of Electronic Materials, 2008, v. 37, n. 2, p. 161, doi. 10.1007/s11664-007-0334-y
- Lim, W. T.;
- Sadik, P. W.;
- Norton, D. P.;
- Gila, B. P.;
- Pearton, S. J.;
- Kravchenko, I. I.;
- Ren, F.
- Article
30
- Journal of Electronic Materials, 2007, v. 36, n. 12, p. 1662, doi. 10.1007/s11664-007-0277-3
- Voss, L. F.;
- Stafford, L.;
- Khanna, R.;
- Gila, B. P.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Ren, F.;
- Kravchenko, I. I.
- Article
31
- Journal of Electronic Materials, 2007, v. 36, n. 10, p. 1320, doi. 10.1007/s11664-007-0203-8
- Polyakov, A. Y.;
- Smirnov, N. B.;
- Govorkov, A. V.;
- Markov, A. V.;
- Yakimov, E. B.;
- Vergeles, P. S.;
- Kolin, N. G.;
- Merkurisov, D. I.;
- Boiko, V. M.;
- In-Hwan Lee;
- Cheul-Ro Lee;
- S. J. Pearton
- Article
32
- Journal of Electronic Materials, 2007, v. 36, n. 4, p. 384, doi. 10.1007/s11664-006-0054-8
- Voss, L. F.;
- Stafford, L.;
- Thaler, G. T.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Chen, J.-J.;
- Ren, F.
- Article
33
- Journal of Electronic Materials, 2007, v. 36, n. 4, p. 391, doi. 10.1007/s11664-006-0040-1
- Hite, J. K.;
- Frazier, R. M.;
- Davies, R. P.;
- Thaler, G. T.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Zavada, J. M.;
- Brown, E.;
- Hömmerich, U.
- Article
34
- Journal of Electronic Materials, 2007, v. 36, n. 4, p. 488, doi. 10.1007/s11664-006-0039-7
- Wright, J. S.;
- Stafford, L.;
- Gila, B. P.;
- Norton, D. P.;
- Pearton, S. J.;
- Hung-Ta Wang;
- Ren, F.
- Article
35
- Journal of Electronic Materials, 2007, v. 36, n. 4, p. 368, doi. 10.1007/s11664-006-0037-9
- Chen, J.-J.;
- Hlad, M.;
- Gerger, A. P.;
- Gila, B. P.;
- Ren, F.;
- Abernathy, C. R.;
- Pearton, S. J.
- Article
36
- Journal of Electronic Materials, 2007, v. 36, n. 4, p. 379, doi. 10.1007/s11664-006-0036-x
- Khanna, Rohit;
- Stafford, L.;
- Pearton, S. J.;
- Anderson, T. J.;
- Ren, F.;
- Kravchenko, I. I.;
- Dabiran, Amir;
- Osinsky, A.;
- Joon Yeob Lee;
- Kwan-Young Lee;
- Jihyun Kim
- Article
37
- Journal of Electronic Materials, 2007, v. 36, n. 4, p. 519, doi. 10.1007/s11664-006-0035-y
- Allums, K. K.;
- Hlad, M.;
- Gerger, A. P.;
- Gila, B. P.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Ren, F.;
- Dwivedi, R.;
- Fogarty, T. N.;
- Wilkins, R.
- Article
38
- Journal of Electronic Materials, 2007, v. 36, n. 4, p. 462, doi. 10.1007/s11664-006-0034-z
- Pearton, S. J.;
- Norton, D. P.;
- Ivill, M. P.;
- Hebard, A. F.;
- Zavada, J. M.;
- Chen, W. M.;
- Buyanova, I. A.
- Article
39
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 862, doi. 10.1007/BF02692541
- Pearton, S. J.;
- Norton, D. P.;
- Heo, Y. W.;
- Tien, L. C.;
- Ivill, M. P.;
- Li, Y.;
- Kang, B. S.;
- Ren, F.;
- Kelly, J.;
- Hebard, A. F.
- Article
40
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 738, doi. 10.1007/s11664-006-0131-z
- Chih-Yang Chang;
- Gou-Chung Chi;
- Wei-Ming Wang;
- Li-Chyong Chen;
- Kuei-Hsien Chen;
- Ren, F.;
- Pearton, S. J.
- Article
41
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 685, doi. 10.1007/s11664-006-0121-1
- Soohwan Jang;
- Ren, F.;
- Pearton, S. J.;
- Gila, B. P.;
- Hlad, M.;
- Abernathy, C. R.;
- Hyucksoo Yang;
- Pan, C. J.;
- Jenn-Inn Chyi;
- Bove, P.;
- Lahreche, H.;
- Thuret, J.
- Article
42
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 680, doi. 10.1007/s11664-006-0120-2
- Hlad, M.;
- Voss, L.;
- Gila, B. P.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Ren, F.
- Article
43
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 675, doi. 10.1007/s11664-006-0119-8
- Anderson, T. J.;
- Ren, F.;
- Covert, L.;
- Lin, J.;
- Pearton, S. J.;
- Dalrymple, T. W.;
- Bozada, C.;
- Fitch, R. C.;
- Moser, N.;
- Bedford, R. G.;
- Schimpf, M.
- Article
44
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 663, doi. 10.1007/s11664-006-0117-x
- Polyakov, A. Y.;
- Smirnov, N. B.;
- Govorkov, A. V.;
- Kozhukhova, E. A.;
- Pearton, S. J.;
- Norton, D. P.;
- Osinsky, A.;
- Dabiran, Amir
- Article
45
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 658, doi. 10.1007/s11664-006-0116-y
- Khanna, Rohit;
- Pearton, S. J.;
- Ren, F.;
- Kravchenko, I.
- Article
46
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 530, doi. 10.1007/s11664-006-0095-z
- Li, Y. J.;
- Heo, Y. W.;
- Erie, J. M.;
- Kim, H.;
- Ip, K.;
- Pearton, S. J.;
- Norton, D. P.
- Article
47
- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 516, doi. 10.1007/s11664-006-0092-2
- Jau-Jiun Chen;
- Soohwan Jang;
- Ren, F.;
- Yuanjie Li;
- Hyun-Sik Kim;
- Norton, D. P.;
- Pearton, S. J.;
- Osinsky, A.;
- Chu, S. N . G.;
- Weaver, J. F.
- Article
48
- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 416, doi. 10.1007/s11664-005-0121-6
- Dong, J. W.;
- Osinsky, A.;
- Hertog, B.;
- Dabiran, A. M.;
- Chow, P. P.;
- Heo, Y. W.;
- Norton, D. P.;
- Pearton, S. J.
- Article
49
- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 409, doi. 10.1007/s11664-005-0120-7
- Heo, Y. W.;
- Kwon, Y. W.;
- Li, Y.;
- Pearton, S. J.;
- Norton, D. P.
- Article
50
- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 395, doi. 10.1007/s11664-005-0117-2
- Khanna, Rohit;
- Ip, K.;
- Allums, K. K.;
- Baik, K.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Heo, Y. W.;
- Norton, D. P.;
- Ren, F.;
- Shojah-Ardalan, S.;
- Wilkins, R.
- Article