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Works matching AU Panfilov, Yuri V.

Results: 4

1

Wafer-scale uniformity improvement of Dolan-bridge Josephson junction by shadow evaporation bias correction.

Published in:

Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-08787-5

By:

Moskaleva, Daria A.;
Korshakov, Nikita D.;
Moskalev, Dmitry O.;
Soloveva, Anastasiya A.;
Matanin, Alexey R.;
Malevannaya, Elizaveta I.;
Smirnov, Nikita S.;
Teleganov, Maksim I.;
Panfilov, Yuri V.;
Rodionov, Ilya A.

Publication type:

Article

2

Wafer-scale uniformity improvement of Dolan-bridge Josephson junction by shadow evaporation bias correction.

Published in:

Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-08787-5

By:

Moskaleva, Daria A.;
Korshakov, Nikita D.;
Moskalev, Dmitry O.;
Soloveva, Anastasiya A.;
Matanin, Alexey R.;
Malevannaya, Elizaveta I.;
Smirnov, Nikita S.;
Teleganov, Maksim I.;
Panfilov, Yuri V.;
Rodionov, Ilya A.

Publication type:

Article

3

ITO film stack engineering for low-loss silicon optical modulators.

Published in:

Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-09973-5

By:

Lotkov, Evgeniy S.;
Baburin, Aleksandr S.;
Ryzhikov, Ilya A.;
Sorokina, Olga S.;
Ivanov, Anton I.;
Zverev, Alexander V.;
Ryzhkov, Vitaly V.;
Bykov, Igor V.;
Baryshev, Alexander V.;
Panfilov, Yuri V.;
Rodionov, Ilya A.

Publication type:

Article

4

Aluminum Josephson junction microstructure and electrical properties modified by thermal annealing.

Published in:

Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-74071-7

By:

Korshakov, Nikita D.;
Moskalev, Dmitry O.;
Soloveva, Anastasia A.;
Moskaleva, Daria A.;
Lotkov, Evgeniy S.;
Ibragimov, Artem R.;
Androschuk, Margarita V.;
Ryzhikov, Ilya A.;
Panfilov, Yuri V.;
Rodionov, Ilya A.

Publication type:

Article