Works by Pan, Mengchun
1
- Photonics, 2024, v. 11, n. 7, p. 677, doi. 10.3390/photonics11070677
- Sun, Jisheng;
- Qiu, Liqiang;
- Liu, Lei;
- Sheng, Liwen;
- Cui, Yudong;
- Huang, Lin;
- Pan, Mengchun;
- Nian, Fushun;
- Hu, Jiafei
- Article
2
- Insight: Non-Destructive Testing & Condition Monitoring, 2018, v. 60, n. 9, p. 507, doi. 10.1784/insi.2018.60.9.507
- Lihui Liu;
- Mengchun Pan;
- Wugang Tian;
- Dixiang Chen;
- Yuan Ren
- Article
3
- Insight: Non-Destructive Testing & Condition Monitoring, 2014, v. 56, n. 9, p. 487, doi. 10.1784/insi.2014.56.9.487
- Fan, Chengguang;
- Pan, Mengchun;
- Luo, Feilu
- Article
4
- Insight: Non-Destructive Testing & Condition Monitoring, 2011, v. 53, n. 9, p. 497, doi. 10.1784/insi.2011.53.9.497
- Tang, Ying;
- Pan, MengChun;
- Luo, FeiLu;
- Tan, XiangLin
- Article
5
- Transactions of Nanjing University of Aeronautics & Astronautics, 2018, v. 35, n. 6, p. 1047, doi. 10.16356/j.1005-1120.2018.06.1047
- Liu Lihui;
- Tian Wugang;
- Pan Mengchun;
- Chen Dixiang;
- Xie Ruifang;
- Ren Yuan
- Article
6
- Advanced Functional Materials, 2025, v. 35, n. 14, p. 1, doi. 10.1002/adfm.202418681
- Hu, Jiafei;
- Liu, Yan;
- Yang, Chengxiu;
- Wu, Shaowei;
- Wang, Haomiao;
- Qin, Yuhang;
- Yong, Yuchen;
- Liu, Lihui;
- Li, Xu;
- Gu, Shijie;
- Hu, Yueguo;
- Li, Peisen;
- Huang, Jian;
- Zhang, Qi;
- Pan, Mengchun
- Article
7
- Applied Sciences (2076-3417), 2024, v. 14, n. 19, p. 8623, doi. 10.3390/app14198623
- Fu, Hongyu;
- Pan, Mengchun;
- Zhang, Qi;
- Hu, Jiafei;
- Guan, Feng;
- Xu, Yujing;
- Huang, Bo;
- Li, Haibin;
- Chen, Dixiang;
- Liu, Zhongyan
- Article
8
- Applied Sciences (2076-3417), 2024, v. 14, n. 2, p. 756, doi. 10.3390/app14020756
- Li, Haibin;
- Zhang, Qi;
- Pan, Mengchun;
- Chen, Dixiang;
- Yu, Ziqiang;
- Xu, Yujing;
- Ding, Zengquan;
- Liu, Xu;
- Wan, Ke;
- Dai, Weiji
- Article
9
- Applied Sciences (2076-3417), 2023, v. 13, n. 5, p. 2830, doi. 10.3390/app13052830
- Chen, Zhuo;
- Wang, Zhenxiong;
- Zhang, Qi;
- Liu, Zhongyan;
- Pan, Mengchun;
- Chen, Dixiang;
- Xu, Yujing
- Article
10
- Applied Sciences (2076-3417), 2022, v. 12, n. 16, p. N.PAG, doi. 10.3390/app12167964
- Huang, Bo;
- Liu, Zhongyan;
- Xu, Yujing;
- Ding, Qiaochu;
- Pan, Mengchun;
- Hu, Jiafei;
- Zhang, Qi
- Article
11
- Nanomaterials (2079-4991), 2021, v. 11, n. 11, p. 3112, doi. 10.3390/nano11113112
- Wu, Ruinan;
- Hu, Yueguo;
- Li, Peisen;
- Peng, Junping;
- Hu, Jiafei;
- Yang, Ming;
- Chen, Dixiang;
- Guo, Yanrui;
- Zhang, Qi;
- Xie, Xiangnan;
- Dai, Jiayu;
- Qiu, Weicheng;
- Wang, Guang;
- Pan, Mengchun
- Article
12
- Sensors (14248220), 2015, v. 15, n. 12, p. 32138, doi. 10.3390/s151229911
- Ruifang Xie;
- Dixiang Chen;
- Mengchun Pan;
- Wugang Tian;
- Xuezhong Wu;
- Weihong Zhou;
- Ying Tang
- Article
13
- Journal of Materials Science, 2021, v. 56, n. 4, p. 3220, doi. 10.1007/s10853-020-05450-4
- Hu, Yueguo;
- Peng, Junping;
- Pan, Mengchun;
- Qiu, Weicheng;
- Wu, Ruinan;
- Hu, Jiafei;
- Hu, Nan;
- Cheng, Feiyu;
- Huang, Rong;
- Li, Fangsen;
- Chen, Dixiang;
- Zhang, Qi;
- Li, Peisen
- Article
14
- Electronics (2079-9292), 2023, v. 12, n. 9, p. 1975, doi. 10.3390/electronics12091975
- Chen, Zhuo;
- Liu, Zhongyan;
- Zhang, Qi;
- Chen, Dixiang;
- Pan, Mengchun;
- Xu, Yujing
- Article
15
- Sensors (14248220), 2020, v. 20, n. 5, p. 1440, doi. 10.3390/s20051440
- Pan, Long;
- Pan, Mengchun;
- Hu, Jiafei;
- Hu, Yueguo;
- Che, Yulu;
- Yu, Yang;
- Wang, Nan;
- Qiu, Weicheng;
- Li, Peisen;
- Peng, Junping;
- Jiang, Jianzhong
- Article
16
- Sensors (14248220), 2019, v. 19, n. 20, p. 4475, doi. 10.3390/s19204475
- Hu, Jiafei;
- Ji, Minhui;
- Qiu, Weicheng;
- Pan, Long;
- Li, Peisen;
- Peng, Junping;
- Hu, Yueguo;
- Liu, Huiyan;
- Pan, Mengchun
- Article
17
- Sensors (14248220), 2018, v. 18, n. 5, p. 1630, doi. 10.3390/s18051630
- Ren, Yuan;
- Pan, Mengchun;
- Chen, Dixiang;
- Tian, Wugang
- Article
18
- IET Science, Measurement & Technology (Wiley-Blackwell), 2017, v. 11, n. 8, p. 1094, doi. 10.1049/iet-smt.2016.0522
- Chengbiao Wan;
- Mengchun Pan;
- Qi Zhang;
- Hongfeng Pang;
- Xuejun Zhu;
- Long Pan;
- Xiaoyong Sun;
- Fenghe Wu
- Article
19
- IET Science, Measurement & Technology (Wiley-Blackwell), 2017, v. 11, n. 8, p. 1094, doi. 10.1049/iet-smt.2016.0522
- Wan, Chengbiao;
- Pan, Mengchun;
- Zhang, Qi;
- Pang, Hongfeng;
- Zhu, Xuejun;
- Pan, Long;
- Sun, Xiaoyong;
- Wu, Fenghe
- Article
20
- IET Science, Measurement & Technology (Wiley-Blackwell), 2017, v. 11, n. 5, p. 600, doi. 10.1049/iet-smt.2016.0392
- Wan, Chengbiao;
- Pan, Mengchun;
- Zhang, Qi;
- Chen, Dixiang;
- Pang, Hongfeng;
- Zhu, Xuejun
- Article
21
- IEEJ Transactions on Electrical & Electronic Engineering, 2016, v. 11, p. S130, doi. 10.1002/tee.22345
- Hu, Xiangchao;
- Pang, Hongfeng;
- Fu, Liangrui;
- Pan, Mengchun
- Article
22
- IEEJ Transactions on Electrical & Electronic Engineering, 2014, v. 9, n. 3, p. 324, doi. 10.1002/tee.21973
- Pang, HongfENg;
- ChEN, Dixiang;
- Pan, MENgchun;
- Luo, Shitu;
- Zhang, Qi;
- Li, Ji;
- Luo, Feilu
- Article
23
- Remote Sensing, 2024, v. 16, n. 5, p. 883, doi. 10.3390/rs16050883
- Li, Haibin;
- Zhang, Qi;
- Pan, Mengchun;
- Chen, Dixiang;
- Liu, Zhongyan;
- Yan, Liang;
- Xu, Yujing;
- Ding, Zengquan;
- Yu, Ziqiang;
- Liu, Xu;
- Wan, Ke;
- Dai, Weiji
- Article
24
- Insight: Non-Destructive Testing & Condition Monitoring, 2019, v. 61, n. 6, p. 331, doi. 10.1784/insi.2019.61.6.331
- Wei Wang;
- Dixiang Chen;
- Mengchun Pan;
- Wugang Tian;
- Yuan Ren
- Article
25
- Advanced Intelligent Systems (2640-4567), 2024, v. 6, n. 6, p. 1, doi. 10.1002/aisy.202300742
- Ji, Minhui;
- Wang, Jiayuan;
- Yang, Liyuan;
- Zhang, Xinmiao;
- Hu, Yueguo;
- Du, Qingfa;
- Hu, Jiafei;
- Qiu, Weicheng;
- Peng, Junping;
- Chen, Xiaowen;
- Luo, Yanxiang;
- Fang, Bin;
- Li, Peisen;
- Pan, Mengchun
- Article
26
- Microsystems & Nanoengineering, 2024, v. 10, n. 1, p. 1, doi. 10.1038/s41378-024-00675-8
- Yang, Chengxiu;
- Hu, Jiafei;
- Liu, Lihui;
- Wu, Shaowei;
- Pan, Mengchun;
- Liu, Yan;
- Wang, Haomiao;
- Li, Peisen;
- Zhang, Qi;
- Qiu, Weicheng;
- Luo, Huihui
- Article
27
- Transactions of the Institute of Measurement & Control, 2014, v. 36, n. 2, p. 244, doi. 10.1177/0142331213497620
- Li, Ji;
- Zhang, Qi;
- Chen, Dixiang;
- Pan, Mengchun;
- Luo, Feilu
- Article
28
- Remote Sensing, 2023, v. 15, n. 17, p. 4164, doi. 10.3390/rs15174164
- Luo, Huihui;
- Pan, Mengchun;
- Du, Qingfa;
- Zhang, Qi;
- Hu, Jiafei;
- Ding, Zengquan
- Article
29
- Micromachines, 2024, v. 15, n. 10, p. 1271, doi. 10.3390/mi15101271
- Kuai, Tao;
- Du, Qingfa;
- Hu, Jiafei;
- Shi, Shilong;
- Li, Peisen;
- Chen, Dixiang;
- Pan, Mengchun
- Article
30
- Micromachines, 2021, v. 12, n. 6, p. 722, doi. 10.3390/mi12060722
- Zhang, Junsheng;
- Pan, Mengchun;
- Du, Qingfa;
- Hu, Jiafei;
- Sun, Kun;
- Yu, Yang;
- Zhang, Xinmiao;
- Luo, Huihui
- Article