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P‐134: Detection of Ion Impurities in Organic Thin Films by Displacement‐Current Measurement Method.
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- SID Symposium Digest of Technical Papers, 2022, v. 53, n. 1, p. 1513, doi. 10.1002/sdtp.15807
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Additional Cover.
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- Journal of the Society for Information Display, 2020, v. 28, n. 11, p. ii, doi. 10.1002/jsid.978
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- Article
Correlation between ion impurity in thermally activated delayed fluorescence organic light‐emitting diode materials and device lifetime.
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- Journal of the Society for Information Display, 2020, v. 28, n. 11, p. 905, doi. 10.1002/jsid.922
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- Article
Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope.
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- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 163, doi. 10.1093/jmicro/53.2.163
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- Article
Atom inlays performed at room temperature using atomic force microscopy.
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- Nature Materials, 2005, v. 4, n. 2, p. 156, doi. 10.1038/nmat1297
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- Article