Works by Oh, Jongchan

Integrating Deep Learning and Deterministic Inversion for Enhancing Fault Detection in Electrical Resistivity Surveys.

Published in:

Applied Sciences (2076-3417), 2023, v. 13, n. 10, p. 6250, doi. 10.3390/app13106250

By:

• Kong, Shinhye;
• Oh, Jongchan;
• Yoon, Daeung;
• Ryu, Dong-Woo;
• Kwon, Hyoung-Seok

Publication type:

Article