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Applications of X-Ray Characterization for Advanced Materials in the Electronics Industry.
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- Metallurgical & Materials Transactions. Part A, 2010, v. 41, n. 5, p. 1167, doi. 10.1007/s11661-009-0116-7
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CASTOR, a new instrument for combined XRR-GIXRF analysis at SOLEIL.
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- XRS: X-ray Spectrometry, 2017, v. 46, n. 5, p. 303, doi. 10.1002/xrs.2742
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- Article