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Analysis of Confidence Lower Limits of Reliability and Hazard Rate for Electronic Stability Control Systems.
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- Quality & Reliability Engineering International, 2013, v. 29, n. 5, p. 621, doi. 10.1002/qre.1380
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- Article
PHONON BEHAVIOR OF SUPERCONDUCTOR AND SEMICONDUCTOR.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 1987, v. 1, n. 2, p. 409, doi. 10.1142/S0217979287000554
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- Article
LATTICE DYNAMICS OF α-<sub>3</sub>.
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- Modern Physics Letters B, 1991, v. 5, n. 17, p. 1167, doi. 10.1142/S0217984991001428
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- Article
A Chinese family carrying novel mutations in SEC23B and HFE2, the genes responsible for congenital dyserythropoietic anaemia II ( CDA II) and primary iron overload, respectively.
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- British Journal of Haematology, 2012, v. 158, n. 1, p. 143, doi. 10.1111/j.1365-2141.2012.09102.x
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- Article