Works matching AU Nellist, P. D.

Results: 33

Applications of Low Dose Electron Ptychography.

Published in:

2022

By:

Kirkland, AI;
Kim, J. S.;
Allen, C. S.;
Huang, C.;
Liberti, E;
O'Leary, CM;
Nellist, P. D.;
Wang, P.

Publication type:

Abstract

Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise.

Published in:

Microscopy & Microanalysis, 2019, p. 488, doi. 10.1017/S1431927618002933

By:

Nellist, P D;
Martinez, G T;
Leary, C O';
Yang, H.;
Stevens, A.;
Browning, N.D.

Publication type:

Article

Exploring the Limits of Focused-Probe STEM Ptychography.

Published in:

Microscopy & Microanalysis, 2019, p. 190, doi. 10.1017/S1431927618001447

By:

Nellist, P. D.;
Martinez, G. T.;
O'Leary, C.;
Jones, L.

Publication type:

Article

Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise.

Published in:

2018

By:

Nellist, P D;
Martinez, G T;
Leary, C O';
Yang, H.;
Stevens, A.;
Browning, N.D.

Publication type:

Abstract

Exploring the Limits of Focused-Probe STEM Ptychography.

Published in:

2018

By:

Nellist, P. D.;
Martinez, G. T.;
O'Leary, C.;
Jones, L.

Publication type:

Abstract

Using Advanced STEM Techniques to Unravel Key Issues in the Development of Next-Generation Nanostructures for Energy Storage.

Published in:

Microscopy & Microanalysis, 2017, v. 23, p. 1698, doi. 10.1017/S1431927617009151

By:

Lozano, J. G.;
Liberti, E.;
Luo, K.;
Martinez, G. T.;
Roberts, M. R.;
Kirkland, A. I.;
Nellist, P. D.;
Bruce, P. G.

Publication type:

Article

Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope.

Published in:

Microscopy & Microanalysis, 2017, v. 23, p. 436, doi. 10.1017/S1431927617002860

By:

Martinez, G. T.;
Pennycook, T. J.;
Naginey, T. C.;
Jones, L.;
Yang, H.;
Yates, J. R.;
Nicholls, R. J.;
Huth, M.;
Simson, M.;
Soltau, H.;
Strüder, L.;
Kondo, Y.;
Sagawa, R.;
Nellist, P. D.

Publication type:

Article

A Comparison of Phase-retrieval Algorithms for Focused-probe Electron Ptychography.

Published in:

Microscopy & Microanalysis, 2017, v. 23, p. 476, doi. 10.1017/S1431927617003063

By:

Martinez, G. T.;
Humphry, M. J.;
Nellist, P. D.

Publication type:

Article

Analysis of Phase Difference Variations for Strong Dynamical Objects Using Wigner Distribution Deconvolution Ptychography.

Published in:

Microscopy & Microanalysis, 2017, v. 23, p. 474, doi. 10.1017/S1431927617003051

By:

Martinez, G. T.;
Yang, H.;
Nellist, P. D.

Publication type:

Article

Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy.

Published in:

2010

By:

Takeguchi, M.;
Okuda, M.;
Hashimoto, A.;
Mitsuishi, K.;
Shimojo, M.;
Zhang, X.;
Wang, P.;
Nellist, P. D.;
Kirkland, A. I.

Publication type:

Abstract

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope.

Published in:

2010

By:

Hashimoto, A.;
Wang, P.;
Shimojo, M.;
Mitsuishi, K.;
Kirkland, A. I.;
Nellist, P. D.;
Takeguchi, M.

Publication type:

Abstract

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy.

Published in:

2010

By:

Nellist, P. D.;
Wang, P.;
Behan, G.;
Kirkland, A. I.;
Hashimoto, A.;
Shimojo, M.;
Mitsuishi, K.;
Takeguchi, M.;
Cosgriff, E.;
D'Alfonso, A. J.;
Allen, L. J.;
Findlay, S. D.

Publication type:

Abstract

Dopant Impurity Induced Nanofaceting on Silicon Nanowire Sidewalls.

Published in:

2010

By:

Li, F.;
Nellist, P. D.;
Lang, C.;
Cockayne, D. J. H.

Publication type:

Abstract

Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures.

Published in:

2010

By:

Nicolosi, V.;
Aslam, Z.;
Kim, J.;
Krivanek, O. L.;
Chisholm, M. F.;
Pennycook, T. J.;
Kirkland 1, A. I.;
Grobert 1, N.;
Nellist, P. D.

Publication type:

Abstract

An Aberration-Corrected STEM for Diffraction Studies.

Published in:

Microscopy & Microanalysis, 2005, v. 11, p. 544, doi. 10.1017/S1431927605510535

By:

Krivanek, O. L.;
Dellby, N.;
McManama-Smith, A.;
Murfitt, M.;
Nellist, P. D.;
Own, C. S.

Publication type:

Article

Materials Applications of Aberration-Corrected STEM.

Published in:

Microscopy & Microanalysis, 2004, v. 10, n. S03, p. 12, doi. 10.1017/S1431927604555678

By:

Pennycook, S. J.;
Chisholm, M. F.;
Varela, M.;
Lupini, A. R.;
Borisevich, A.;
Peng, Y.;
Van Benthem, K.;
Shibata, N.;
Dravid, V. P.;
Prabhumirashi, P.;
Findlay, S. D.;
Oxley, M. P.;
Allen, L. J.;
Dellby, N.;
Nellist, P. D.;
Szilagyi, Z. S.;
Krivanek, O. L.

Publication type:

Article

Observation of van der Waals Driven Self-Assembly of MoSI Nanowires into a Low-Symmetry Structure Using Aberration-Corrected Electron Microscopy.

Published in:

Advanced Materials, 2007, v. 19, n. 4, p. 543, doi. 10.1002/adma.200601867

By:

Nicolosi, V.;
Nellist, P. D.;
Sanvito, S.;
Cosgriff, E. C.;
Krishnamurthy, S.;
Blau, W. J.;
Green, M. L. H.;
Vengust, D.;
Dvorsek, D.;
Mihailovic, D.;
Compagnini, G.;
Sloan, J.;
Stolojan, V.;
Carey, J. D.;
Pennycook, S. J.;
Coleman, J. N.

Publication type:

Article

High Angle Dark Field STEM for Advanced Materials.

Published in:

Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 36, doi. 10.1093/oxfordjournals.jmicro.a023410

By:

Pennycook, S. J.;
Jesson, D. E.;
McGibbon, A. J.;
Nellist, P. D.

Publication type:

Article

Analysis of nanometre-sized pyrogenic particles in the scanning transmission electron microscope.

Published in:

Journal of Microscopy, 1996, v. 184, n. 3, p. 185, doi. 10.1046/j.1365-2818.1996.1020659.x

By:

WALLIS, D. J.;
Browning, N. D.;
Megaridis, C. M.;
Nellist, P. D.

Publication type:

Article

Effect of Eshelby twist on core structure of screw dislocations in molybdenum: atomic structure and electron microscope image simulations.

Published in:

Philosophical Magazine, 2011, v. 91, n. 18, p. 2364, doi. 10.1080/14786435.2011.562474

By:

Groger, R.;
Dudeck, K. J.;
Nellist, P. D.;
Vitek, V.;
Hirsch, P. B.;
Cockayne, D. J. H.

Publication type:

Article

Applications of the Oxford-JEOL aberration-corrected electron microscope.

Published in:

Philosophical Magazine, 2010, v. 90, n. 35/36, p. 4751, doi. 10.1080/14786435.2010.516775

By:

Nellist, P. D.;
Kirkland, A. I.

Publication type:

Article

ADF STEM imaging of screw dislocations viewed end-on.

Published in:

Philosophical Magazine, 2010, v. 90, n. 33, p. 4361, doi. 10.1080/14786435.2010.505183

By:

Cosgriff, E. C.;
Nellist, P. D.;
Hirsch, P. B.;
Zhou, Z.;
Cockayne, D. J. H.

Publication type:

Article

Selection rules for Bloch wave scattering for HREM imaging of imperfect crystals along symmetry axes.

Published in:

Philosophical Magazine, 2008, v. 88, n. 2, p. 135, doi. 10.1080/14786430701765828

By:

Nellist, P. D.;
Cosgriff, E. C.;
Hirsch, P. B.;
Cockayne, D. J. H.

Publication type:

Article

Compositional quantification of PtCo acid-leached fuel cell catalysts using EDX partial cross sections.

Published in:

Materials Science & Technology, 2016, v. 32, n. 3, p. 248, doi. 10.1080/02670836.2015.1133021

By:

MacArthur, K. E.;
Slater, T. J. A.;
Haigh, S. J.;
Ozkaya, D.;
Nellist, P. D.;
Lozano-Perez, S.

Publication type:

Article

Atomic Structure of a 36.8 (210) Tilt Grain Boundary in TiO<sub>2</sub>.

Published in:

Journal of the American Ceramic Society, 1997, v. 80, n. 2, p. 499, doi. 10.1111/j.1151-2916.1997.tb02857.x

By:

Wallis, D. J.;
Browning, N. D.;
Nellist, P. D.;
Pennycook, S. J.;
Majid, I.;
Liu, Y.;
Sande, J. B. Vander

Publication type:

Article

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures.

Published in:

Nature Communications, 2016, v. 7, n. 8, p. 12532, doi. 10.1038/ncomms12532

By:

Yang, H.;
Rutte, R. N.;
Jones, L.;
Simson, M.;
Sagawa, R.;
Ryll, H.;
Huth, M.;
Pennycook, T. J.;
Green, M.L.H.;
Soltau, H.;
Kondo, Y.;
Davis, B. G.;
Nellist, P. D.

Publication type:

Article

Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning.

Published in:

Nature Communications, 2015, v. 6, n. 6, p. 7266, doi. 10.1038/ncomms8266

By:

Yang, H.;
Lozano, J. G.;
Pennycook, T. J.;
Jones, L.;
Hirsch, P. B.;
Nellist, P. D.

Publication type:

Article

Excited helium under high pressures in the bulk and in nanobubbles.

Published in:

Philosophical Magazine Letters, 2017, v. 97, n. 8, p. 295, doi. 10.1080/09500839.2017.1347724

By:

Pyper, N. C.;
Naginey, T. C.;
Nellist, P. D.;
Whelan, Colm T.

Publication type:

Article

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.

Published in:

Microscopy & Microanalysis, 2000, v. 6, n. 4, p. 343, doi. 10.1007/s100050010045

By:

Pennycook, S. J.;
Rafferty, B.;
Nellist, P. D.

Publication type:

Article

The Atomic-Scale Origins of Grain Boundary Superconducting Properties.

Published in:

Microscopy & Microanalysis, 1998, p. 688, doi. 10.1017/S1431927600023564

By:

J. Pennycook, S.;
Buban, J.;
Prouteau, C.;
Chisholm, M. F.;
Nellist, P. D.;
Browning, N. D.

Publication type:

Article

Subcellular localisation and identification of single atoms using quantitative scanning transmission electron microscopy.

Published in:

Journal of Microscopy, 2025, v. 299, n. 1, p. 36, doi. 10.1111/jmi.13410

By:

Sheader, A. A.;
Vizcay‐Barrena, G;
Fleck, R. A.;
Flatters, S. J. L.;
Nellist, P. D.

Publication type:

Article

An optical configuration for fastidious STEM detector calibration and the effect of the objective‐lens pre‐field.

Published in:

Journal of Microscopy, 2018, v. 270, n. 2, p. 176, doi. 10.1111/jmi.12672

By:

JONES, L.;
VARAMBHIA, A.;
SAWADA, H.;
NELLIST, P. D.

Publication type:

Article

Observation of metal nanoparticles at atomic resolution in Pt‐based cancer chemotherapeutics.

Published in:

Journal of Microscopy, 2018, v. 270, n. 1, p. 92, doi. 10.1111/jmi.12659

By:

SHEADER, A. A.;
VARAMBHIA, A. M.;
FLECK, R. A.;
FLATTERS, S. J. L.;
NELLIST, P. D.

Publication type:

Article