Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy.Published in:Nanoscale Research Letters, 2018, v. 13, n. 1, p. 1, doi. 10.1186/s11671-018-2536-zBy:Slobodian, Oleksandr M.;Lytvyn, Peter M.;Nikolenko, Andrii S.;Naseka, Victor M.;Khyzhun, Oleg Yu.;Vasin, Andrey V.;Sevostianov, Stanislav V.;Nazarov, Alexei N.Publication type:Article