Works matching AU Mukesh, Sagarika

A Review of the Gate-All-Around Nanosheet FET Process Opportunities.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 21, p. 3589, doi. 10.3390/electronics11213589

By:

• Mukesh, Sagarika;
• Zhang, Jingyun

Publication type:

Article