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X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab.
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- Particle & Particle Systems Characterization, 2009, v. 26, n. 3, p. 112, doi. 10.1002/ppsc.200800052
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- Article
State-of-the-art of Multilayer Optics for Laboratory X-ray Devices.
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- Particle & Particle Systems Characterization, 2005, v. 22, n. 6, p. 378, doi. 10.1002/ppsc.200501000
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- Article
A comparison of a microfocus X-ray source and a conventional sealed tube for crystal structure determination.
- Published in:
- Journal of Applied Crystallography, 2009, v. 42, n. 5, p. 885, doi. 10.1107/S0021889809030921
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- Article