Theoretical and Experimental Study of the Formation of Grown-in and As-Grown Microdefects in Dislocation-Free Silicon Single Crystals Grown by the Czochralski Method.
- Published in:
- Crystallography Reports, 2005, v. 50, n. 7, p. S159, doi. 10.1134/1.2133994
- By:
- Publication type:
- Article