Atomic layer deposition of hafnium oxide dielectrics on silicon and germanium substrates.
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- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 119, doi. 10.1007/s10854-007-9337-y
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- Article
Works by McNeill, D. W.
Results: 3
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2
SPECIAL EDUCATION IN CANADA as provided by local systems.
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- Exceptional Children, 1954, v. 20, n. 5, p. 209, doi. 10.1177/001440295402000504
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- Article
3
Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples.
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- Journal of Raman Spectroscopy, 2012, v. 43, n. 3, p. 448, doi. 10.1002/jrs.3052
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- Article