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Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon.
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- Advanced Electronic Materials, 2023, v. 9, n. 5, p. 1, doi. 10.1002/aelm.202201212
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Refractive Indices of Ge and Si at Temperatures between 4–296 K in the 4–8 THz Region.
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- Applied Sciences (2076-3417), 2021, v. 11, n. 2, p. 487, doi. 10.3390/app11020487
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Virus lasers for biological detection.
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- Nature Communications, 2019, v. 10, n. 1, p. N.PAG, doi. 10.1038/s41467-019-11604-z
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- Article