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High-Resolution Nanoimprinting with a Robust and Reusable Polymer Mold.
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- Advanced Functional Materials, 2007, v. 17, n. 14, p. 2419, doi. 10.1002/adfm.200600710
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The Spirit of ECASIA.
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- Surface & Interface Analysis: SIA, 2002, v. 34, n. 1, p. 1, doi. 10.1002/sia.1240
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Angle-resolved XPS analysis of molybdenum and tungsten in passive films on stainless steel PVD alloys.
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- Surface & Interface Analysis: SIA, 2002, v. 34, n. 1, p. 130, doi. 10.1002/sia.1268
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ToF-SIMS and XPS study of photoactivatable reagents designed for surface glycoengineering. Part III. 5-Carboxamidopentyl- N-[ m-[3-(trifluoromethyl)diazirin-3-yl]phenyl-β- D-galactopyranosyl]-(1->4)-1-thio-β- D-glucopyranoside (lactose aryl diazirine) on diamond
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 6, p. 457, doi. 10.1002/sia.1071
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Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 4, p. 292, doi. 10.1002/(SICI)1096-9918(200004)29:4<292::AID-SIA863>3.0.CO;2-L
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Part 1. N-( m-(3-(trifluoromethyl)diazirine-3-yl)phenyl)-4-maleimido-butyramide (MAD) on silicon, silicon nitride and diamond.
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- Surface & Interface Analysis: SIA, 1998, v. 26, n. 11, p. 783, doi. 10.1002/(SICI)1096-9918(199810)26:11<783::AID-SIA420>3.0.CO;2-O
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Part 2. N-[ m-(3-(trifluoromethyl)diazirine-3-yl)phenyl]-4- (-3-thio(-1- D-galactopyrannosyl)-maleimidyl)butyramide (MAD-Gal) on diamond.
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- Surface & Interface Analysis: SIA, 1998, v. 26, n. 11, p. 793, doi. 10.1002/(SICI)1096-9918(199810)26:11<793::AID-SIA421>3.0.CO;2-K
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A combination of SFM and TOF-SIMS imaging for observing local inhomogenieties in morphology and composition: aged calcite surfaces.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 13, p. 959, doi. 10.1002/(SICI)1096-9918(199712)25:13<959::AID-SIA321>3.0.CO;2-W
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On the role of molecular photofragmentation during depth profiling of tantalum oxide layers by laser SNMS.
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- Surface & Interface Analysis: SIA, 1995, v. 23, n. 12, p. 844, doi. 10.1002/sia.740231207
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Reactive ion sputter depth profiling of tantalum oxides: A comparative study using ToF-SIMS and laser-SNMS.
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- Surface & Interface Analysis: SIA, 1995, v. 23, n. 9, p. 641, doi. 10.1002/sia.740230910
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The antibody response in the bovine mammary gland is influenced by the adjuvant and the site of subcutaneous vaccination.
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- Veterinary Research, 2018, v. 49, p. 1, doi. 10.1186/s13567-018-0521-2
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An octavalent vaccine provides pregnant gilts protection against a highly virulent porcine parvovirus strain.
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- BMC Veterinary Research, 2020, v. 16, n. 1, p. 1, doi. 10.1186/s12917-020-2272-3
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Secondary ion mass spectrometry analysis of iron oxides with known <sup>18</sup>O/<sup>16</sup>O contents.
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- Surface & Interface Analysis: SIA, 1994, v. 21, n. 11, p. 800, doi. 10.1002/sia.740211110
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Preparation of thin AlO<sub> x</sub> (0 ≤ x ≤ 1.5) films on gold and polycarbonate characterized by XPS, EPMA, AFM and TEM.
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- Surface & Interface Analysis: SIA, 1994, v. 21, n. 8, p. 546, doi. 10.1002/sia.740210806
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Passive film composition and pitting behaviour of Fe-25Cr-11Nb studied by scanning Auger microscopy.
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- Surface & Interface Analysis: SIA, 1993, v. 20, n. 9, p. 755, doi. 10.1002/sia.740200903
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Interlaboratory comparison of the depth resolution in sputter depth profiling of Ni/Cr multilayers with and without sample rotation using AES, XPS, and SIMS.
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- Surface & Interface Analysis: SIA, 1993, v. 20, n. 8, p. 621, doi. 10.1002/sia.740200803
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SIMS study on the composition of FeCr and FeCrMo oxide films.
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- Surface & Interface Analysis: SIA, 1991, v. 17, n. 6, p. 383, doi. 10.1002/sia.740170614
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Application of factor analysis to the AES and XPS study of the oxidation of chromium.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 178, doi. 10.1002/sia.740160135
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Intercomparison of surface analysis of thin aluminium oxide films.
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- Surface & Interface Analysis: SIA, 1990, v. 15, n. 11, p. 681, doi. 10.1002/sia.740151108
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SIMS/AES characterization of the initial oxidation of an iron-chromium-molybdenum alloy and its base metals at room temperature.
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- Surface & Interface Analysis: SIA, 1989, v. 14, n. 11, p. 744, doi. 10.1002/sia.740141111
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The investigation of passive films on iron-chromium alloys by AES and XPS.
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- Surface & Interface Analysis: SIA, 1988, v. 12, n. 7, p. 429, doi. 10.1002/sia.740120712
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Transfer and treatment of AES, XPS and SIMS data with a network computer station.
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- Surface & Interface Analysis: SIA, 1988, v. 12, n. 2, p. 78, doi. 10.1002/sia.740120203
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Investigation of a passive film on an ironchromium alloy by AES and XPS.
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- Surface & Interface Analysis: SIA, 1988, v. 11, n. 4, p. 182, doi. 10.1002/sia.740110403
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Simultaneous AES and SIMS depth profiling of standard Ta<sub>2</sub>O<sub>5</sub> films.
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- Surface & Interface Analysis: SIA, 1988, v. 11, n. 1/2, p. 88, doi. 10.1002/sia.740110111
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AES sputter profiling and angle resolved XPS of in situ grown very thin Tantalum-oxide films.
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- Surface & Interface Analysis: SIA, 1984, v. 6, n. 2, p. 82, doi. 10.1002/sia.740060209
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On the influence of crater geometry on depth resolution of AES and XPS profiles of tantalum oxide films.
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- Surface & Interface Analysis: SIA, 1983, v. 5, n. 2, p. 77, doi. 10.1002/sia.740050205
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Experimental study of matrix effects in quantitative auger analysis of binary metal alloys.
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- Surface & Interface Analysis: SIA, 1981, v. 3, n. 4, p. 153, doi. 10.1002/sia.740030403
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Tarnishing of Au-Ag-Cu alloy studied by Auger electron spectroscopy and coulometry.
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- Materials & Corrosion / Werkstoffe und Korrosion, 1991, v. 42, n. 6, p. 288, doi. 10.1002/maco.19910420603
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Spontaneous movement of ions through calcite at standard temperature and pressure.
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- Nature, 1998, v. 396, n. 6709, p. 356, doi. 10.1038/24597
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