Works by Matesa, JM

Nanomilling for Aberration – Corrected TEM and HAADF STEM.

Published in:

Microscopy & Microanalysis, 2009, v. 15, n. S2, p. 348, doi. 10.1017/S1431927609098420

By:

• Cerchiara, RR;
• Fischione, PE;
• Liu, J;
• Matesa, JM;
• Robins, AC;
• Fraser, HL;
• Genc, A

Publication type:

Article