Nanomilling for Aberration – Corrected TEM and HAADF STEM.Published in:Microscopy & Microanalysis, 2009, v. 15, n. S2, p. 348, doi. 10.1017/S1431927609098420By:Cerchiara, RR;Fischione, PE;Liu, J;Matesa, JM;Robins, AC;Fraser, HL;Genc, APublication type:Article