Found: 7
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Monte Carlo simulation of full energy spectrum of electrons emitted from silicon in Auger electron spectroscopy.
- Published in:
- Surface & Interface Analysis: SIA, 2015, v. 47, n. 1, p. 113, doi. 10.1002/sia.5682
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- Article
Simulation study of the atomic resolution secondary electron imaging.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1296, doi. 10.1002/sia.5565
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- Article
Quantification of surface roughness effect on elastically backscattered electrons.
- Published in:
- Surface & Interface Analysis: SIA, 2014, v. 46, n. 7, p. 489, doi. 10.1002/sia.5554
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- Article
Systematic calculation of the surface excitation parameters for 22 materials.
- Published in:
- Surface & Interface Analysis: SIA, 2013, v. 45, n. 3, p. 773, doi. 10.1002/sia.5164
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- Article
Influence of surface roughness on elastically backscattered electrons.
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- Surface & Interface Analysis: SIA, 2012, v. 44, n. 6, p. 647, doi. 10.1002/sia.4807
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- Article
A Monte Carlo study of the spin polarization of secondary electrons.
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- Surface & Interface Analysis: SIA, 2012, v. 44, n. 6, p. 703, doi. 10.1002/sia.4823
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- Article
Monte Carlo simulation of secondary electron images for real sample structures in scanning electron microscopy.
- Published in:
- Scanning, 2012, v. 34, n. 3, p. 145, doi. 10.1002/sca.20288
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- Article