Works by Mangababu, A.
Results: 8
Picosecond Laser-Ablated Nanoparticles Loaded Filter Paper for SERS-Based Trace Detection of Thiram, 1,3,5-Trinitroperhydro-1,3,5-triazine (RDX), and Nile Blue.
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- Nanomaterials (2079-4991), 2022, v. 12, n. 13, p. 2150, doi. 10.3390/nano12132150
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- Article
Effects of swift heavy ion irradiation on the performance of HfO2-based resistive random access memory devices.
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- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 3, p. 2973, doi. 10.1007/s10854-020-05049-0
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- Article
Picosecond Bessel Beam Fabricated Pure, Gold-Coated Silver Nanostructures for Trace-Level Sensing of Multiple Explosives and Hazardous Molecules.
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- Materials (1996-1944), 2022, v. 15, n. 12, p. 4155, doi. 10.3390/ma15124155
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- Article
Effects of Initial Grain Size and Laser Parameters on HfO2 Nanoparticles Prepared Using Femtosecond Laser Ablation in Liquids.
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- Journal of Electronic Materials, 2021, v. 50, n. 4, p. 1742, doi. 10.1007/s11664-020-08610-z
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- Article
Structural characterization of AlCuFe icosahedral quasicrystal nanoparticles synthesized using femtosecond laser ablation.
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- Journal of Materials Science, 2025, v. 60, n. 3, p. 1689, doi. 10.1007/s10853-024-10515-9
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- Article
Radiation tolerance and defect dynamics of ALD-grown HfTiO<sub>x</sub>-based MOS capacitors.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2023, v. 178, n. 1/2, p. 83, doi. 10.1080/10420150.2023.2186872
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- Article
120 MeV Ag ion irradiation induced intermixing, grain fragmentation in HfO<sub>2</sub>/GaO<sub>x</sub> thin films and consequent effects on the electrical properties of HfO<sub>2</sub>/GaO<sub>x</sub>/Si-based MOS capacitors.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2020, v. 175, n. 1/2, p. 150, doi. 10.1080/10420150.2020.1718140
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- Article
Influence of the bottom metal electrode and gamma irradiation effects on the performance of HfO<sub>2</sub>-based RRAM devices.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2019, v. 174, n. 1/2, p. 66, doi. 10.1080/10420150.2019.1579213
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- Article