Works matching AU Mangababu, A.


Results: 9
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    120 MeV Ag ion irradiation induced intermixing, grain fragmentation in HfO<sub>2</sub>/GaO<sub>x</sub> thin films and consequent effects on the electrical properties of HfO<sub>2</sub>/GaO<sub>x</sub>/Si-based MOS capacitors.

    Published in:
    Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2020, v. 175, n. 1/2, p. 150, doi. 10.1080/10420150.2020.1718140
    By:
    • Vinod Kumar, K.;
    • Arun, N.;
    • Mangababu, A.;
    • Ojha, Sunil;
    • Nageswara Rao, S. V. S.;
    • Pathak, A. P.
    Publication type:
    Article
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