Kinetics of Structural and Phase Transformations in Thin SiO<sub>x</sub> Films in the Course of a Rapid Thermal Annealing.Published in:Semiconductors, 2005, v. 39, n. 10, p. 1197, doi. 10.1134/1.2085270By:Dan'ko, V. A.;Indutnyı, I. Z.;Lysenko, V. S.;Maıdanchuk, I. Yu.;Min'ko, V. I.;Nazarov, A. N.;Tkachenko, A. S.;Shepelyavyı, P. E.Publication type:Article