Found: 17
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The Creation of the Center of Metrological Assurance of Nanotechnologies and Assessment of the Compliance of the Products of the Nano Industry.
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- Measurement Techniques, 2016, v. 58, n. 11, p. 1210, doi. 10.1007/s11018-016-0871-y
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Creation of Calibrated Samples of a Measure with Relief Elements Less Than 100 nm.
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- Measurement Techniques, 2016, v. 58, n. 11, p. 1214, doi. 10.1007/s11018-016-0872-x
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- Article
High-Q Factor Optical Whispering-Gallery Mode Microresonators and Their Use in Precision Measurements.
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- Measurement Techniques, 2015, v. 57, n. 12, p. 1386, doi. 10.1007/s11018-015-0639-9
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Determination of the Metrological Characteristics of the Near-Field Scanning Optical Microscope in the Study of Biological Objects.
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- Measurement Techniques, 2014, v. 56, n. 10, p. 1173, doi. 10.1007/s11018-014-0351-1
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Specific Nature of Formation of Uncertainty in Measurements of the Geometric Parameters of Surface Texture by Means of Methods of High-Resolution Interferometry.
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- Measurement Techniques, 2013, v. 56, n. 9, p. 999, doi. 10.1007/s11018-013-0319-6
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Analysis of Uncertainties caused by Procedural and Instrumental Interferometry Errors in the Texture and Shape Parameters of a Surface.
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- Measurement Techniques, 2013, v. 56, n. 9, p. 1006, doi. 10.1007/s11018-013-0320-0
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Fractal Methods for the Characterization of the Topography and Texture of a Surface.
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- Measurement Techniques, 2013, v. 56, n. 3, p. 247, doi. 10.1007/s11018-013-0188-z
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Areal Methods of Analysis of Topography and Texture of Surface in Micro- and Nanometric Ranges.
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- Measurement Techniques, 2013, v. 56, n. 3, p. 240, doi. 10.1007/s11018-013-0187-0
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- Article
Standard Sources of Low-Level Optical Radiation Based on Nanotechnologies.
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- Measurement Techniques, 2013, v. 56, n. 1, p. 41, doi. 10.1007/s11018-013-0156-7
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Investigation of the structure and dynamics of complex chemical compounds by the dynamic light scattering method.
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- Measurement Techniques, 2012, v. 55, n. 6, p. 734, doi. 10.1007/s11018-012-0030-z
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- Article
An investigation of methods of measuring the diameter of the electron probe of scanning electron microscopes using modern nanometer band standard measures.
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- Measurement Techniques, 2010, v. 53, n. 9, p. 996, doi. 10.1007/s11018-010-9610-y
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- Article
Comparative investigations of the measurement capabilities of atomic-force microscopy and optical interferometry methods.
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- Measurement Techniques, 2010, v. 53, n. 8, p. 878, doi. 10.1007/s11018-010-9591-x
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- Article
Excitons in CdS and CdSe Semiconducting Quantum Wires with Dielectric Barriers.
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- Journal of Experimental & Theoretical Physics, 2002, v. 94, n. 6, p. 1169, doi. 10.1134/1.1493169
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Methods and Models for Decision-Making in Systems Engineering for Creating (Developing) Distributed Organizational Information and Control Systems.
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- Journal of Computer & Systems Sciences International, 2020, v. 59, n. 2, p. 245, doi. 10.1134/S1064230720020033
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Study of the correlation properties of the surface structure of nc-Si/ a-Si:H films with different fractions of the crystalline phase.
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- Semiconductors, 2016, v. 50, n. 5, p. 590, doi. 10.1134/S1063782616050031
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Application of whispering-gallery-mode optical microcavities for detection of silver nanoparticles in an aqueous medium.
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- Optics & Spectroscopy, 2017, v. 122, n. 6, p. 1002, doi. 10.1134/S0030400X17060194
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Modification of the structure and hydrogen content of amorphous hydrogenated silicon films under conditions of femtosecond laser-induced crystallization.
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- Technical Physics Letters, 2014, v. 40, n. 2, p. 141, doi. 10.1134/S1063785014020217
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- Article