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Improvement of accuracy of interferometric measurement of wedge angle of plates.
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- Optics & Spectroscopy, 2010, v. 109, n. 4, p. 641, doi. 10.1134/S0030400X10100243
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- Article
Reducing the error of residual wedge angle measurement on plates by shear interferometry.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 969, doi. 10.1134/S1063785010100287
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- Article
Imaging optical fiber pitch deviations in multifiber lightguide structures.
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- Technical Physics Letters, 2010, v. 36, n. 1, p. 69, doi. 10.1134/S1063785010010220
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Universal interferometric device for the quality control of optical elements.
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- Technical Physics Letters, 2009, v. 35, n. 2, p. 183, doi. 10.1134/S1063785009020254
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High-sensitivity holographic interferometry method for studying transparent objects with small transverse size.
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- Technical Physics, 2008, v. 53, n. 11, p. 1458, doi. 10.1134/S1063784208110108
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Optimization of interference fringe tuning by improving the sensitivity of measurements of the phase step height.
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- Technical Physics, 2008, v. 53, n. 11, p. 1519, doi. 10.1134/S1063784208110200
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- Article
Highly sensitive comparative analysis of periodic structures using lateral shear interferometry.
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- Optics & Spectroscopy, 2008, v. 105, n. 1, p. 124, doi. 10.1134/S0030400X08070199
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- Article
Real-time holographic interferometry using superposed compensating holograms.
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- Technical Physics, 2007, v. 52, n. 8, p. 1040, doi. 10.1134/S1063784207080130
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- Article
Double-exposure variable shear holographic interferometry with controlled sensitivity.
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- Optics & Spectroscopy, 2006, v. 101, n. 6, p. 962, doi. 10.1134/S0030400X06120216
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- Article
Holographic interferometry of phase objects by recording lateral shear holograms on two carriers placed in series.
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- Technical Physics, 2006, v. 51, n. 10, p. 1351, doi. 10.1134/S106378420610015X
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- Article
Shearing interferometry using lateral shears in opposite directions.
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- Optics & Spectroscopy, 2006, v. 101, n. 3, p. 473, doi. 10.1134/S0030400X06090232
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- Article
Holographic reverse shearing interferometry with high measurement sensitivity.
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- Optics & Spectroscopy, 2006, v. 101, n. 1, p. 162, doi. 10.1134/S0030400X06070265
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- Article
Multiple-exposure holographic interferometry with rotation of a recording medium for investigation of fast processes.
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- Optics & Spectroscopy, 2006, v. 100, n. 3, p. 463, doi. 10.1134/S0030400X06030258
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- Article
Detection of macrodefects in spatially periodic structures using a two-mirror interferometer.
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- Technical Physics, 2006, v. 51, n. 1, p. 118, doi. 10.1134/S1063784206010178
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- Article
Aberration-Free Lateral Shear Holographic Interferometry.
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- Technical Physics, 2005, v. 50, n. 9, p. 1182, doi. 10.1134/1.2051459
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- Article
A Method for Increasing the Sensitivity of Determination of the Wavefront Distortion in Optical Processing of Holographic Lateral Shear Interferograms.
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- Optics & Spectroscopy, 2005, v. 99, n. 1, p. 141, doi. 10.1134/1.1999907
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- Article
Revealing Macrodefects in Periodic Structures of the Transmission Type in White Light on the Basis of Shift of Images.
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- Optics & Spectroscopy, 2005, v. 98, n. 3, p. 477, doi. 10.1134/1.1890531
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- Article
Two-Wavelength Dispersion Holographic Lateral-Shift Interferometry.
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- Technical Physics, 2004, v. 49, n. 11, p. 1473, doi. 10.1134/1.1826193
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- Article
Interference Comparative Analysis of the Shape of Wavefronts of Incoherent Light Beams.
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- Optics & Spectroscopy, 2004, v. 96, n. 3, p. 421, doi. 10.1134/1.1690036
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- Article
Determination of a Surface Macrorelief with the Double-Exposure Fringe Projection Method.
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- Optics & Spectroscopy, 2004, v. 96, n. 3, p. 473, doi. 10.1134/1.1690046
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- Article
Effect of Aberrations in Formation of Holographic Lateral Shear Interferograms under High Measurement Sensitivity.
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- Optics & Spectroscopy, 2004, v. 96, n. 1, p. 136, doi. 10.1134/1.1643998
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- Article
Enhancement of Measurement Sensitivity in Determination of Changes in the Shape of a Wavefront by Holographic Lateral-Shearing Interferometry.
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- Optics & Spectroscopy, 2004, v. 96, n. 1, p. 142, doi. 10.1134/1.1643999
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- Article
Interferometric Flaw Detection with an Increased Sensitivity of Measurements in Study of Reflecting Composite Periodic Structures.
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- Optics & Spectroscopy, 2002, v. 93, n. 5, p. 810, doi. 10.1134/1.1524005
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- Article
Enhancement of Sensitivity of Measurements of the Holographic Lateral-Shear Interferometry in Studies of Fast Processes.
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- Optics & Spectroscopy, 2002, v. 93, n. 3, p. 472, doi. 10.1134/1.1509832
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- Article
Extension of the Controlled Sensitivity Range in Holographic Interferometry with a Lateral Shear.
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- Optics & Spectroscopy, 2002, v. 93, n. 3, p. 477, doi. 10.1134/1.1509833
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- Article
Enhancement of the Measurement Sensitivity in Multiple-Exposure Holographic Interferometry.
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- Optics & Spectroscopy, 2002, v. 93, n. 1, p. 136, doi. 10.1134/1.1496737
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- Article
Multiple-Exposure High-Sensitivity Holographic Interferometry for Studying Moving Objects.
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- Technical Physics, 2002, v. 47, n. 6, p. 708, doi. 10.1134/1.1486193
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- Article
Enhancing Sensitivity of a Contactless Method for Measuring Profiles and Revealing Macrodefects in Composite Periodic Structures of the Transmission Type.
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- Optics & Spectroscopy, 2002, v. 92, n. 2, p. 305, doi. 10.1134/1.1454049
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- Article
Coherent Optical Processing of Two-Exposure Photographic Images of Projected Fringes.
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- Optics & Spectroscopy, 2001, v. 91, n. 5, p. 786, doi. 10.1134/1.1420863
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- Article
Recording and Optical Processing of Images of Projected Fringes in the Study of Objects with a Periodic Surface Texture.
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- Optics & Spectroscopy, 2001, v. 91, n. 2, p. 300, doi. 10.1134/1.1397915
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- Article
High-Sensitivity Moire Flaw Detection for Comparison of Periodic Composite Structures.
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- Technical Physics, 2001, v. 46, n. 5, p. 587, doi. 10.1134/1.1372951
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- Article
Control of the Tuning of Reference Fringes in the Interference Pattern of Changes in the Object State in the Optical Processing of Holograms and Photographic Images with the Same Spatial Carrier.
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- Optics & Spectroscopy, 2000, v. 88, n. 5, p. 768, doi. 10.1134/1.626875
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- Article
Methods for achieving high measurement sensitivity in holographic interferometry by rewriting holograms using incoherent light.
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- Technical Physics, 1999, v. 44, n. 12, p. 1462, doi. 10.1134/1.1259549
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- Article
Interference detection of flaws in periodic objects in real time with adjustable sensitivity.
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- Technical Physics, 1999, v. 44, n. 10, p. 1242, doi. 10.1134/1.1259501
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Enhancement of the measurement sensitivity in real-time optical image processing for objects with a periodic structure.
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- Technical Physics, 1999, v. 44, n. 7, p. 862, doi. 10.1134/1.1259367
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Alignment on moiré fringes of finite width during optical processing of images of a periodic amplitude grating which are distorted by the reconstructed wave front.
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- Technical Physics, 1999, v. 44, n. 2, p. 252
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Color coding of images of deformed zones of diffusely scattering surfaces during optical processing of photographs of projected fringes.
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- Technical Physics, 1998, v. 43, n. 11, p. 1366, doi. 10.1134/1.1259201
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Achieving a high sensitivity of measurements in optical systems for rewriting holograms by incoherent light.
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- Technical Physics Letters, 1998, v. 24, n. 6, p. 487, doi. 10.1134/1.1262156
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- Article
Visualization of strains of diffusely scattering surfaces in the optical treatment of photographs of projected fringes using spatial filtering.
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- Technical Physics, 1998, v. 43, n. 3, p. 332, doi. 10.1134/1.1258920
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- Article
Use of moiré effects in the optical treatment of images of a periodic amplitude grating distorted by a reconstructed wave front.
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- Technical Physics, 1997, v. 42, n. 7, p. 845
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- Article
Quantitative method for determining the angles of deflection of light rays reconstructed from the hologram of a phase object.
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- Technical Physics, 1997, v. 42, n. 3, p. 287
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- Article
Increasing the measurement sensitivity in comparing the microrelief of diffusely scattering surfaces.
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- Technical Physics, 1997, v. 42, n. 3, p. 313, doi. 10.1134/1.1258683
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- Article