Found: 23
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Selective Area Epitaxy of Quasi-1-Dimensional Topological Nanostructures and Networks.
- Published in:
- Nanomaterials (2079-4991), 2023, v. 13, n. 2, p. 354, doi. 10.3390/nano13020354
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- Article
Reaching for atomic-scale quantitative energy dispersive X-ray spectroscopy.
- Published in:
- 2021
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- Abstract
Reaching for atomic-scale quantitative energy dispersive X-ray spectroscopy.
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- 2021
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- Abstract
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale.
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- Microscopy & Microanalysis, 2021, v. 27, n. 3, p. 528, doi. 10.1017/S1431927621000246
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- Article
Flux periodic oscillations and phase-coherent transport in GeTe nanowire-based devices.
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- Nature Communications, 2021, v. 12, n. 1, p. 1, doi. 10.1038/s41467-021-21042-5
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- Article
Proximity‐Effect‐Induced Superconductivity in Nb/Sb<sub>2</sub>Te<sub>3</sub>‐Nanoribbon/Nb Junctions.
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- Annalen der Physik, 2020, v. 532, n. 8, p. 1, doi. 10.1002/andp.202000273
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- Article
Utilizing Low-Dose Transmission Electron Microscopy for Structure and Defect Identification in Group III - Nitride Electronic Devices.
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- Microscopy & Microanalysis, 2019, p. 1972, doi. 10.1017/S1431927618010346
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- Article
Utilizing Low-Dose Transmission Electron Microscopy for Structure and Defect Identification in Group III - Nitride Electronic Devices.
- Published in:
- 2018
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- Abstract
Nondestructive Method for the Determination of the Electric Polarization Orientation in Thin Films: Illustration on Gallium Ferrite Thin Films.
- Published in:
- Small Methods, 2017, v. 1, n. 12, p. 1, doi. 10.1002/smtd.201700234
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- Article
Unerwartete Ge-Ge-Kontakte in der zweidimensionalen Phase Ge<sub>4</sub>Se<sub>3</sub>Te und Analyse ihres chemischen Ursprungs mittels Energiedichte(DOE)-Funktion.
- Published in:
- Angewandte Chemie, 2017, v. 129, n. 34, p. 10338, doi. 10.1002/ange.201612121
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- Article
Innenrücktitelbild: Unerwartete Ge-Ge-Kontakte in der zweidimensionalen Phase Ge<sub>4</sub>Se<sub>3</sub>Te und Analyse ihres chemischen Ursprungs mittels Energiedichte(DOE)-Funktion (Angew. Chem. 34/2017).
- Published in:
- Angewandte Chemie, 2017, v. 129, n. 34, p. 10381, doi. 10.1002/ange.201706616
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- Article
Unexpected Ge-Ge Contacts in the Two-Dimensional Ge<sub>4</sub>Se<sub>3</sub>Te Phase and Analysis of Their Chemical Cause with the Density of Energy (DOE) Function.
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- Angewandte Chemie International Edition, 2017, v. 56, n. 34, p. 10204, doi. 10.1002/anie.201612121
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- Article
Inside Back Cover: Unexpected Ge-Ge Contacts in the Two-Dimensional Ge<sub>4</sub>Se<sub>3</sub>Te Phase and Analysis of Their Chemical Cause with the Density of Energy (DOE) Function (Angew. Chem. Int. Ed. 34/2017).
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- Angewandte Chemie International Edition, 2017, v. 56, n. 34, p. 10247, doi. 10.1002/anie.201706616
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- Article
A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation.
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- Microscopy & Microanalysis, 2017, v. 23, n. 4, p. 782, doi. 10.1017/S1431927617000514
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- Article
Bi<sub>1</sub>Te<sub>1</sub> is a dual topological insulator.
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- Nature Communications, 2017, v. 8, n. 4, p. 14976, doi. 10.1038/ncomms14976
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- Article
Realization of a vertical topological p-n junction in epitaxial Sb<sub>2</sub>Te<sub>3</sub>/Bi<sub>2</sub>Te<sub>3</sub> heterostructures.
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- Nature Communications, 2015, v. 6, n. 11, p. 8816, doi. 10.1038/ncomms9816
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- Article
Direct gas-phase synthesis of single-phase β-FeSi nanoparticles.
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- Journal of Nanoparticle Research, 2013, v. 15, n. 9, p. 1, doi. 10.1007/s11051-013-1878-9
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- Article
Mn Valency at La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub>/SrTiO<sub>3</sub> (0 01) Thin Film Interfaces.
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- Microscopy & Microanalysis, 2009, v. 15, n. 3, p. 213, doi. 10.1017/S1431927609090229
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- Article
Microstructure of Nanocrystalline Yttria-Doped Zirconia Thin Films Obtained by Sol–Gel Processing.
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- Journal of the American Ceramic Society, 2008, v. 91, n. 7, p. 2281, doi. 10.1111/j.1551-2916.2008.02400.x
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- Article
Introduction: A Special Issue on Frontiers of Electron Microscopy in Materials Science.
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- Microscopy & Microanalysis, 2006, v. 12, n. 6, p. 441, doi. 10.1017/S1431927606060727
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- Article
Frontiers of Electron Microscopy in Materials Science 2005.
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- Journal of Materials Science, 2006, v. 41, n. 14, p. 4377, doi. 10.1007/s10853-006-0155-z
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- Article
HRTEM investigation of the epitaxial growth of scandate/titanate multilayers.
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- Journal of Materials Science, 2006, v. 41, n. 14, p. 4434, doi. 10.1007/s10853-006-0083-y
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- Article
Quantitative pressure and strain field analysis of helium precipitates in silicon.
- Published in:
- Journal of Materials Science, 2006, v. 41, n. 14, p. 4454, doi. 10.1007/s10853-006-0153-1
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- Article