Works matching AU Lopez Paya, Luis

Face Recognition Bias Assessment through Quality Estimation Models.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 22, p. 4649, doi. 10.3390/electronics12224649

By:

• Lopez Paya, Luis;
• Cordoba, Pedro;
• Sanchez Perez, Angela;
• Barrachina, Javier;
• Benavent-Lledo, Manuel;
• Mulero-Pérez, David;
• Garcia-Rodriguez, Jose

Publication type:

Article