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Structural characterization and electrical properties of Nd2O3 by sol–gel method.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 4, p. 3111, doi. 10.1007/s10854-020-02857-2
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- Article
Impact of interfacial layer using ultra-thin SiO<sub>2</sub> on electrical and structural characteristics of Gd<sub>2</sub>O<sub>3</sub> MOS capacitor.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 20, p. 17473, doi. 10.1007/s10854-018-9847-9
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- Publication type:
- Article
Fabrication and characterization of resistance temperature detector by smart mask design.
- Published in:
- International Journal of Advanced Manufacturing Technology, 2022, v. 122, n. 1, p. 147, doi. 10.1007/s00170-022-09041-2
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- Publication type:
- Article