Works matching AU Lin, Dunmin
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1060, doi. 10.1007/s10854-009-9998-9
- Article
2
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 7, p. 649, doi. 10.1007/s10854-009-9971-7
- Dunmin Lin;
- Qiaoji Zheng;
- Kwok, K. W.;
- Chenggang Xu;
- Chun Yang
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 625, doi. 10.1007/s10854-009-9967-3
- Qiaoji Zheng;
- Dunmin Lin;
- Xiaochun Wu;
- Chenggang Xu;
- Chun Yang;
- Kwok, K. W.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 3, p. 291, doi. 10.1007/s10854-009-9907-2
- Article
5
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 5, p. 393, doi. 10.1007/s10854-008-9741-y
- Dunmin Lin;
- Chenggang Xu;
- Qiaoji Zheng;
- Yujun Wei;
- Daojiang Gao
- Article
6
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1054, doi. 10.1007/s10854-007-9458-3
- Chenggang Xu;
- Dunmin Lin;
- Kwok, K. W.
- Article
7
- Journal of Materials Science, 2013, v. 48, n. 3, p. 1035, doi. 10.1007/s10853-012-6835-y
- Jiang, Meng;
- Lin, Qin;
- Lin, Dunmin;
- Zheng, Qiaoji;
- Fan, Ximing;
- Wu, Xiaochun;
- Sun, Hailing;
- Wan, Yang;
- Wu, Lang
- Article
8
- Journal of Materials Science, 2012, v. 47, n. 1, p. 397, doi. 10.1007/s10853-011-5811-2
- Article
9
- Journal of Materials Science, 2009, v. 44, n. 18, p. 4953, doi. 10.1007/s10853-009-3756-5
- Article
10
- Journal of Materials Science, 2009, v. 44, n. 10, p. 2466, doi. 10.1007/s10853-009-3314-1
- Gao, Daojiang;
- Kwok, K.;
- Lin, Dunmin;
- Chan, H.
- Article
11
- ChemElectroChem, 2019, v. 6, n. 13, p. 3410, doi. 10.1002/celc.201900744
- Ren, Juan;
- Song, Zhicui;
- Zhou, Xuemei;
- Chai, Yuru;
- Lu, Xiaoli;
- Zheng, Qiaoji;
- Xu, Chenggang;
- Lin, Dunmin
- Article
12
- ChemElectroChem, 2017, v. 4, n. 12, p. 3181, doi. 10.1002/celc.201700810
- Zhou, Yibei;
- Ren, Juan;
- Xia, Li;
- Wu, Huali;
- Xie, Fengyu;
- Zheng, Qiaoji;
- Xu, Chenggang;
- Lin, Dunmin
- Article
13
- ChemElectroChem, 2017, v. 4, n. 6, p. 1362, doi. 10.1002/celc.201600823
- Deng, Yunlong;
- Mou, Jirong;
- Wu, Huali;
- Zhou, Lin;
- Zheng, Qiaoji;
- Lam, Kwok Ho;
- Xu, Chenggang;
- Lin, Dunmin
- Article
14
- International Journal of Applied Ceramic Technology, 2011, v. 8, n. 3, p. 684, doi. 10.1111/j.1744-7402.2010.02500.x
- Lin, Dunmin;
- Kwok, Kin Wing
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1777, doi. 10.1007/s11664-016-5228-4
- He, Lihua;
- Zou, Xiao;
- Wang, Tao;
- Zheng, Qiaoji;
- Jiang, Na;
- Xu, Chenggang;
- Liu, Yongfu;
- Lin, Dunmin
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3696, doi. 10.1007/s11664-015-3730-8
- Wu, Xiaochun;
- Xiao, Ping;
- Guo, Yongquan;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
17
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 7, p. 9650, doi. 10.1007/s10854-021-05626-x
- Wu, Keying;
- Wang, Hua;
- Zhou, Xinyi;
- Yang, Lu;
- Yu, Binglan;
- Yang, Qian;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
18
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 3, p. 2600, doi. 10.1007/s10854-018-0535-6
- Tang, Lin;
- Zhou, Yibei;
- Zhou, Xinyi;
- Chai, Yuru;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
19
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 3, p. 2563, doi. 10.1007/s10854-018-0531-x
- Wang, Dongmei;
- Liao, You;
- Peng, Zhengxin;
- Zheng, Qiaoji;
- Wei, Xianhua;
- Wang, Tao;
- Lin, Dunmin
- Article
20
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5531, doi. 10.1007/s10854-016-6216-4
- Guo, Yongquan;
- Wang, Tao;
- Shi, Dongliang;
- Xiao, Ping;
- Zheng, Qiaoji;
- Xu, Chenggang;
- Lam, Kwok;
- Lin, Dunmin
- Article
21
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 3, p. 2826, doi. 10.1007/s10854-016-5865-7
- Zou, Xiao;
- He, Lihua;
- Li, Rong;
- Zheng, Qiaoji;
- Liu, Yongfu;
- Xu, Chenggang;
- Lin, Dunmin
- Article
22
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 5741, doi. 10.1007/s10854-016-4487-4
- Guo, Yongquan;
- Wang, Tao;
- He, Lihua;
- Zheng, Qiaoji;
- Liao, Jie;
- Xu, Chenggang;
- Lin, Dunmin
- Article
23
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 12, p. 9451, doi. 10.1007/s10854-015-3376-6
- Luo, Lingling;
- Zhou, Lin;
- Zou, Xiao;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
24
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 11, p. 8341, doi. 10.1007/s10854-015-3500-7
- Wen, Rui;
- Zhou, Lin;
- Zou, Xiao;
- Luo, Lingling;
- Jiang, Na;
- Zheng, Qiaoji;
- Liao, Jie;
- Xu, Chenggang;
- Lin, Dunmin
- Article
25
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 11, p. 8840, doi. 10.1007/s10854-015-3564-4
- Tian, Mijie;
- Zhou, Lin;
- Zou, Xiao;
- Zheng, Qiaoji;
- Luo, Lingling;
- Jiang, Na;
- Lin, Dunmin
- Article
26
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 6979, doi. 10.1007/s10854-015-3317-4
- Zhou, Lin;
- Zou, Xiao;
- Tian, Mijie;
- Lei, Fengying;
- Zheng, Qiaoji;
- Sun, Ting;
- Lin, Dunmin
- Article
27
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4981, doi. 10.1007/s10854-015-3010-7
- Jiang, Na;
- Luo, Lingling;
- Lei, Fengying;
- Zheng, Qiaoji;
- Xu, Chenggang;
- Liao, Jie;
- Lin, Dunmin
- Article
28
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 978, doi. 10.1007/s10854-014-2492-z
- Wu, Xiaochun;
- Tian, Mijie;
- Guo, Yongquan;
- Zheng, Qiaoji;
- Luo, Lingling;
- Lin, Dunmin
- Article
29
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 3753, doi. 10.1007/s10854-014-2086-9
- Guo, Yongquan;
- Xiao, Ping;
- Luo, Lingling;
- Jiang, Na;
- Lei, Fengying;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
30
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 6, p. 2638, doi. 10.1007/s10854-014-1923-1
- Zheng, Qiaoji;
- Guo, Yongquan;
- Lei, Fengying;
- Wu, Xiaochun;
- Lin, Dunmin
- Article
31
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 4, p. 1736, doi. 10.1007/s10854-014-1792-7
- Luo, Lingling;
- Jiang, Na;
- Lei, Fengying;
- Guo, Yongquan;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
32
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1534, doi. 10.1007/s10854-014-1764-y
- Wan, Yang;
- Li, Ying;
- Guo, Yongquan;
- Zheng, Qiaoji;
- Wu, Xiaochun;
- Xu, Chenggang;
- Lin, Dunmin
- Article
33
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 10, p. 3836, doi. 10.1007/s10854-013-1326-8
- Zheng, Qiaoji;
- Ma, Jian;
- Lin, Dunmin
- Article
34
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 734, doi. 10.1007/s10854-012-0802-x
- Lin, Qin;
- Jiang, Meng;
- Lin, Dunmin;
- Zheng, Qiaoji;
- Wu, Xiaochun;
- Fan, Ximing
- Article
35
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 2, p. 501, doi. 10.1007/s10854-011-0425-7
- Article
36
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 11, p. 1119, doi. 10.1007/s10854-009-0029-7
- Article
37
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 1, p. 60, doi. 10.1002/pssa.201532294
- Lei, Fengying;
- Zou, Xiao;
- Wen, Rui;
- Liu, Mengli;
- Zheng, Qiaoji;
- Jiang, Na;
- Luo, Lingling;
- Lin, Dunmin
- Article
38
- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 9, p. 2012, doi. 10.1002/pssa.201532127
- Luo, Lingling;
- Jiang, Na;
- Zou, Xiao;
- Shi, Dongliang;
- Sun, Ting;
- Zheng, Qiaoji;
- Xu, Chenggang;
- Lam, Kwok Ho;
- Lin, Dunmin
- Article
39
- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 3, p. 632, doi. 10.1002/pssa.201431485
- Zhou, Wei;
- Zheng, Qiaoji;
- Li, Ying;
- Li, Qiang;
- Wan, Yang;
- Wu, Min;
- Lin, Dunmin
- Article
40
- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 4, p. 869, doi. 10.1002/pssa.201330252
- Sun, Hailing;
- Zheng, Qiaoji;
- Wan, Yang;
- Li, Qiang;
- Chen, Yan;
- Wu, Xiao;
- Kwok, Kin Wing;
- Chan, Helen Wong Lai‐Wa;
- Lin, Dunmin
- Article
41
- Physica Status Solidi. A: Applications & Materials Science, 2012, v. 209, n. 12, p. 2610, doi. 10.1002/pssa.201228254
- Fan, Ximing;
- Lin, Dunmin;
- Zheng, Qiaoji;
- Sun, Hailing;
- Wan, Yang;
- Wu, Xiaochun;
- Wu, Lang
- Article
42
- Physica Status Solidi. A: Applications & Materials Science, 2012, v. 209, n. 11, p. 2299, doi. 10.1002/pssa.201228406
- Fu, Lingling;
- Lin, Dunmin;
- Zheng, Qiaoji;
- Wu, Xiaochun;
- Xu, Chenggang
- Article
43
- Physica Status Solidi. A: Applications & Materials Science, 2012, v. 209, n. 3, p. 505, doi. 10.1002/pssa.201127268
- Lin, Dunmin;
- Zheng, Qiaoji;
- Wu, Xiaochun;
- Fan, Ximing;
- Sun, Hailing;
- Wu, Lang;
- Xu, Chenggang
- Article
44
- Journal of Solid State Electrochemistry, 2017, v. 21, n. 12, p. 3467, doi. 10.1007/s10008-017-3688-y
- Zhou, Lin;
- Liu, Jing;
- Huang, Lisi;
- Jiang, Na;
- Zheng, Qiaoji;
- Lin, Dunmin
- Article
45
- Applied Physics A: Materials Science & Processing, 2009, v. 97, n. 1, p. 229, doi. 10.1007/s00339-009-5189-z
- Article
46
- Applied Physics A: Materials Science & Processing, 2008, v. 93, n. 2, p. 549, doi. 10.1007/s00339-008-4667-z
- Dunmin Lin;
- Qiaoji Zheng;
- Chenggang Xu;
- Kwok, K. W.
- Article
47
- Applied Physics A: Materials Science & Processing, 2008, v. 91, n. 1, p. 167, doi. 10.1007/s00339-007-4391-0
- Dunmin Lin;
- Kwok, K. W.;
- Chan, H. L. W.
- Article
48
- Applied Physics A: Materials Science & Processing, 2008, v. 90, n. 1, p. 165, doi. 10.1007/s00339-007-4246-8
- Yunwen Liao;
- Dingquan Xiao;
- Dunmin Lin
- Article
49
- Integrated Ferroelectrics, 2013, v. 142, n. 1, p. 7, doi. 10.1080/10584587.2013.780145
- Lai, Xin;
- Wei, Yanyan;
- Qin, Dan;
- Zhao, Yan;
- Wu, Yun;
- Gao, Daojiang;
- Bi, Jian;
- Lin, Dunmin;
- Xu, Guangliang
- Article
50
- Integrated Ferroelectrics, 2013, v. 140, n. 1, p. 177, doi. 10.1080/10584587.2012.741910
- Lai, Xin;
- Wei, Yanyan;
- Qin, Dan;
- Zhao, Yan;
- Wu, Yun;
- Gao, Daojiang;
- Bi, Jian;
- Lin, Dunmin;
- Xu, Guangliang
- Article