Works matching AU Liardet, Pierre-Yvan

Spatial Location in Integrated Circuits through Infrared Microscopy †.

Published in:

Sensors (14248220), 2021, v. 21, n. 6, p. 2175, doi. 10.3390/s21062175

By:

• Abelé, Raphaël;
• Damoiseaux, Jean-Luc;
• Moubtahij, Redouane El;
• Boi, Jean-Marc;
• Fronte, Daniele;
• Liardet, Pierre-Yvan;
• Merad, Djamal;
• Aider, Omar Ait;
• Avdelidis, Nico P.

Publication type:

Article