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Strong coupling in molecular systems: a simple predictor employing routine optical measurements.
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- Nanophotonics (21928606), 2024, v. 13, n. 14, p. 2453, doi. 10.1515/nanoph-2023-0879
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- Article
Augmenting light coverage for photosynthesis through YFP-enhanced charge separation at the Rhodobacter sphaeroides reaction centre.
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- Nature Communications, 2017, v. 8, n. 1, p. 13972, doi. 10.1038/ncomms13972
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- Article
Use of Engineered Unique Cysteine Residues to Facilitate Oriented Coupling of Proteins Directly to a Gold Substrate.
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- Photochemistry & Photobiology, 2011, v. 87, n. 5, p. 1050, doi. 10.1111/j.1751-1097.2011.00948.x
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- Article
Nanoscale Biomolecular Structures on Self-Assembled Monolayers Generated from Modular Pegylated Disulfides.
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- Chemistry - A European Journal, 2010, v. 16, n. 40, p. 12234, doi. 10.1002/chem.200902439
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- Article
Templated formation of giant polymer vesicles with controlled size distributions.
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- Nature Materials, 2009, v. 8, n. 6, p. 507, doi. 10.1038/nmat2446
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- Article
Nanopatterns and Nanostructures at Interfaces, Mulhouse, 1215 October 2003.
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- ChemPhysChem, 2004, v. 5, n. 3, p. 419, doi. 10.1002/cphc.200301203
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- Article
Scanning force microscopy of polyester: surface structure and adhesive properties.
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- Macromolecular Symposia, 2001, v. 167, n. 1, p. 101, doi. 10.1002/1521-3900(200103)167:1<101::AID-MASY101>3.0.CO;2-T
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- Article
Tapping mode and phase imaging of biaxially oriented polyester films.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 1, p. 39, doi. 10.1002/sia.950
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- Article
Frictional, adhesive and mechanical properties of polyester films probed by scanning force microscopy.
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- Surface & Interface Analysis: SIA, 1999, v. 27, n. 12, p. 1084, doi. 10.1002/(SICI)1096-9918(199912)27:12<1084::AID-SIA680>3.0.CO;2-6
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- Article
Characterization of plasma-deposited styrene films by XPS and static SIMS.
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- Surface & Interface Analysis: SIA, 1995, v. 23, n. 1, p. 22, doi. 10.1002/sia.740230104
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- Article
The structure of the PET m/ z 152 ion and implications for ion formation mechanisms in static SIMS.
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- Surface & Interface Analysis: SIA, 1992, v. 18, n. 8, p. 637, doi. 10.1002/sia.740180811
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- Article