Found: 19
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Influences and Diffusion Effects of Lithium Contamination during the Thermal Oxidation Process of Silicon.
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- Advanced Engineering Materials, 2024, v. 26, n. 13, p. 1, doi. 10.1002/adem.202400396
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- Article
Ferroelectric Field Effect Transistors–Based Content‐Addressable Storage‐Class Memory: A Study on the Impact of Device Variation and High‐Temperature Compatibility.
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- Advanced Intelligent Systems (2640-4567), 2024, v. 6, n. 4, p. 1, doi. 10.1002/aisy.202300461
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- Article
Toward Energy‐Efficient Ferroelectric Field‐Effect Transistors and Ferroelectric Random Access Memories: Tailoring the Coercive Field of Ferroelectric HfO<sub>2</sub> Films.
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- Physica Status Solidi. A: Applications & Materials Science, 2024, v. 221, n. 6, p. 1, doi. 10.1002/pssa.202300712
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An Ultracompact Single‐Ferroelectric Field‐Effect Transistor Binary and Multibit Associative Search Engine.
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- Advanced Intelligent Systems (2640-4567), 2023, v. 5, n. 7, p. 1, doi. 10.1002/aisy.202200428
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- Article
Demonstration of Differential Mode Ferroelectric Field‐Effect Transistor Array‐Based in‐Memory Computing Macro for Realizing Multiprecision Mixed‐Signal Artificial Intelligence Accelerator.
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- Advanced Intelligent Systems (2640-4567), 2023, v. 5, n. 6, p. 1, doi. 10.1002/aisy.202200389
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- Article
A Study on Imprint Behavior of Ferroelectric Hafnium Oxide Caused by High‐Temperature Annealing.
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- Physica Status Solidi. A: Applications & Materials Science, 2023, v. 220, n. 7, p. 1, doi. 10.1002/pssa.202300067
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- Article
Review on the Microstructure of Ferroelectric Hafnium Oxides.
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- Physica Status Solidi - Rapid Research Letters, 2022, v. 16, n. 10, p. 1, doi. 10.1002/pssr.202200168
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- Article
Pyroelectric and Ferroelectric Properties of Hafnium Oxide Doped with Si via Plasma Enhanced ALD.
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- Crystals (2073-4352), 2022, v. 12, n. 8, p. 1115, doi. 10.3390/cryst12081115
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- Article
Tuning Hyrbrid Ferroelectric and Antiferroelectric Stacks for Low Power FeFET and FeRAM Applications by Using Laminated HSO and HZO films.
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- Advanced Electronic Materials, 2022, v. 8, n. 5, p. 1, doi. 10.1002/aelm.202100837
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- Article
Electric field-induced crystallization of ferroelectric hafnium zirconium oxide.
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- Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-01724-2
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- Article
RF-Characterization of HZO Thin Film Varactors.
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- Crystals (2073-4352), 2021, v. 11, n. 8, p. 980, doi. 10.3390/cryst11080980
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- Article
A Fully Integrated Ferroelectric Thin‐Film‐Transistor – Influence of Device Scaling on Threshold Voltage Compensation in Displays.
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- Advanced Electronic Materials, 2021, v. 7, n. 6, p. 1, doi. 10.1002/aelm.202100082
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- Article
On the Origin of Wake‐Up and Antiferroelectric‐Like Behavior in Ferroelectric Hafnium Oxide.
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- Physica Status Solidi - Rapid Research Letters, 2021, v. 15, n. 5, p. 1, doi. 10.1002/pssr.202100086
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- Article
On the Origin of Wake‐Up and Antiferroelectric‐Like Behavior in Ferroelectric Hafnium Oxide.
- Published in:
- Physica Status Solidi - Rapid Research Letters, 2021, v. 15, n. 5, p. 1, doi. 10.1002/pssr.202100086
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- Publication type:
- Article
On the Origin of Wake‐Up and Antiferroelectric‐Like Behavior in Ferroelectric Hafnium Oxide.
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- Physica Status Solidi - Rapid Research Letters, 2021, v. 15, n. 5, p. 1, doi. 10.1002/pssr.202100086
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- Article
Back‐End‐of‐Line Compatible Low‐Temperature Furnace Anneal for Ferroelectric Hafnium Zirconium Oxide Formation.
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- Physica Status Solidi. A: Applications & Materials Science, 2020, v. 217, n. 8, p. 1, doi. 10.1002/pssa.201900840
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- Article
Back‐End‐of‐Line Compatible Low‐Temperature Furnace Anneal for Ferroelectric Hafnium Zirconium Oxide Formation.
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- Physica Status Solidi. A: Applications & Materials Science, 2020, v. 217, n. 8, p. 1, doi. 10.1002/pssa.201900840
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- Article
Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi Diffraction.
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- Nanomaterials (2079-4991), 2020, v. 10, n. 2, p. 384, doi. 10.3390/nano10020384
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Intentional Incorporation and Tailoring of Point Defects during Sublimation Growth of Cubic Silicon Carbide by Variation of Process Parameters.
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- Physica Status Solidi (B), 2020, v. 257, n. 1, p. N.PAG, doi. 10.1002/pssb.201900286
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- Article