Found: 4
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Quantification of aluminium and silicon‐containing materials using Ag Lα X‐rays.
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- Surface & Interface Analysis: SIA, 2024, v. 56, n. 7, p. 425, doi. 10.1002/sia.7301
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- Article
Applying monochromated silver X‐rays to the surface characterization of silicon‐containing materials.
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- Surface & Interface Analysis: SIA, 2023, v. 55, n. 6, p. 548, doi. 10.1002/sia.7143
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- Article
HAXPES binding energy scale linearity check.
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- Surface & Interface Analysis: SIA, 2023, v. 55, n. 2, p. 91, doi. 10.1002/sia.7156
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- Article
Surface physico-chemistry of corona-discharge-treated poly(ethylene terephthalate) film.
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- Surface & Interface Analysis: SIA, 2002, v. 33, n. 7, p. 617, doi. 10.1002/sia.1429
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- Article