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Effect of the shear layer on the etching behavior of 6060 aluminum extrusion alloys.
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- Surface & Interface Analysis: SIA, 2019, v. 51, n. 12, p. 1251, doi. 10.1002/sia.6632
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Grain boundary passivation studied by in situ scanning tunneling microscopy on microcrystalline copper.
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- Journal of Solid State Electrochemistry, 2015, v. 19, n. 12, p. 3501, doi. 10.1007/s10008-015-2787-x
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- Article