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Characterization of Materials at the Nanoscale Using Hard X-ray Microspectroscopy Techniques.
- Published in:
- 2018
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- Publication type:
- Abstract
Characterization of Materials at the Nanoscale Using Hard X-ray Microspectroscopy Techniques.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
X-ray mirrors with sub-nanometre figure errors obtained by differential deposition of thin WSi<sub>2</sub> films.
- Published in:
- Journal of Synchrotron Radiation, 2023, v. 30, n. 4, p. 708, doi. 10.1107/S1600577523003697
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- Publication type:
- Article
X‐ray mirror figure correction by differential deposition and off‐line metrology.
- Published in:
- Journal of Synchrotron Radiation, 2019, v. 26, n. 6, p. 1872, doi. 10.1107/S1600577519012256
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- Publication type:
- Article
ID16B: a hard X-ray nanoprobe beamline at the ESRF for nano-analysis.
- Published in:
- Journal of Synchrotron Radiation, 2016, v. 23, n. 1, p. 344, doi. 10.1107/S1600577515019839
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- Publication type:
- Article
Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility.
- Published in:
- Journal of Synchrotron Radiation, 2012, v. 19, n. 1, p. 10, doi. 10.1107/S090904951104249X
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- Publication type:
- Article