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Simulation and Analysis of the Optical Characteristics of Cylindrical Micropillars with InAs/GaAs Quantum Dots.
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- JETP Letters, 2022, v. 116, n. 9, p. 613, doi. 10.1134/S0021364022800207
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- Article
Room-temperature 1.3-μm lasing in a microdisk with quantum dots.
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- Semiconductors, 2006, v. 40, n. 9, p. 1101, doi. 10.1134/S106378260609020X
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- Article
VCSELs based on arrays of sub-monolayer InGaAs quantum dots.
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- Semiconductors, 2006, v. 40, n. 5, p. 615, doi. 10.1134/S1063782606050186
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- Article
Design and Fabrication Technology for Arrays for Vertical-Cavity Surface-Emitting Lasers.
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- Semiconductors, 2005, v. 39, n. 4, p. 462, doi. 10.1134/1.1900263
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- Article
Investigation of Anomalous Lasing in Vertical-Cavity Surface-Emitting Lasers of the 850-nm Spectral Range with a Double Oxide Current Aperture at Large Gain-to-Cavity Detuning.
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- Optics & Spectroscopy, 2020, v. 128, n. 8, p. 1174, doi. 10.1134/S0030400X20080081
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- Article
The Effect of Active Region Heating on Dynamic and Power Characteristics of Quantum Cascade Lasers Emitting at a Wavelength of 4.8 µm at Room Temperature.
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- Optics & Spectroscopy, 2019, v. 127, n. 3, p. 479, doi. 10.1134/S0030400X19090066
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- Article
The Design of an Electrically-Driven Single Photon Source of the 1.3-μm Spectral Range Based on a Vertical Microcavity with Intracavity Contacts.
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- Technical Physics Letters, 2021, v. 47, n. 3, p. 222, doi. 10.1134/S1063785021030056
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- Article
The Effect of a Saturable Absorber in Long-Wavelength Vertical-Cavity Surface-Emitting Lasers Fabricated by Wafer Fusion Technology.
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- Technical Physics Letters, 2020, v. 46, n. 12, p. 1257, doi. 10.1134/S1063785020120172
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- Article
A Vertical-Cavity Surface-Emitting Laser for the 1.55-μm Spectral Range with Tunnel Junction Based on n<sup>++</sup>-InGaAs/p<sup>++</sup>-InGaAs/p<sup>++</sup>-InAlGaAs Layers.
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- Technical Physics Letters, 2020, v. 46, n. 9, p. 854, doi. 10.1134/S1063785020090023
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- Article
The Influence of Cavity Design on the Linewidth of Near-IR Single-Mode Vertical-Cavity Surface-Emitting Lasers.
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- Technical Physics Letters, 2018, v. 44, n. 1, p. 28, doi. 10.1134/S1063785018010042
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- Article